4 Revision History
Changes from D Revision (July 2016) to E Revision
- Changed the Device Information tableGo
- Changed the Pin Configuration images Go
Changes from C Revision (June 2016) to D Revision
- Added DB Package to the Device Information tableGo
Changes from A Revision (July 2009) to B Revision
- Added Pin Configuration and Functions section, ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section Go
Changes from B Revision (July 2015) to C Revision
- Added RGE Package to the Device Information tableGo
- Changed VIH for I2C pins limited to VCC, with note allowing higher voltage Go
- Added IOL for different TjGo
- Removed ΔICC spec from the Electrical Characteristics table, added ΔICC typical characteristics graph Go
- Changed ICC standby into different input statesGo
- Changed Cio maximum Go
- Changed Typical characteristic plots with updated dataGo
- POR requirements, bounded lowest voltage allowed during glitch Go