SPRSP62B December 2022 – December 2024 TDA4AL-Q1 , TDA4VE-Q1 , TDA4VL-Q1
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
PARAMETER | TEST CONDITIONS | MIN | NOM | MAX | UNIT | |
---|---|---|---|---|---|---|
VIL | Input low-level threshold | 0.35 × VDDSHV(1) | V | |||
VILSS | Input low-level threshold steady state | 0.20 | V | |||
VIH | Input high-level threshold | 0.65 × VDDSHV(1) | V | |||
VIHSS | Input high-level threshold steady state | 1.4 | V | |||
IIN | Input Leakage Current | VI = 1.8 V or 0 V | ±10 | µA | ||
IOZ | Tri-state Output Leakage Current | VO = 1.8 V or 0 V | ±10 | µA | ||
RPU | Pull-up Resistor | 15 | 20 | 25 | kΩ | |
RPD | Pull-down Resistor | 15 | 20 | 25 | kΩ | |
VOL | Output low-level voltage | 0.30 | V | |||
VOH | Output high-level voltage | VDDSHV - 0.30(1) | V | |||
IOL | Low Level Output Current | VOL(MAX) | 2 | mA | ||
IOH | High Level Output Current | VOH(MAX) | 2 | mA | ||
SRI | Input Slew Rate | 5E +8 | V/s |