SLOS081N February 1977 – June 2024 TL081 , TL081A , TL081B , TL081H , TL082 , TL082A , TL082B , TL082H , TL084 , TL084A , TL084B , TL084H
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
SR | Slew rate | VI = 10V, CL = 100pF, RL = 2kΩ | TL08xM | 5 | 20 | V/μs | |
TL08xC, TL08xAC, TL08xBC, TL08xI |
8 | 20 | V/μs | ||||
tS | Settling time | VI = 20V, CL = 100pF, RL = 2kΩ | 0.1 | μs | |||
20% | |||||||
eN | Input voltage noise density | All PS and NS packages; All TL08xM devices | RS = 20 Ω, f = 1kHz | 18 | nV/√Hz | ||
All other devices | f = 1kHz | 37 | nV/√Hz | ||||
f = 10kHz | 21 | ||||||
EN | Input voltage noise | All PS and NS packages; All TL08xM devices | RS = 20 Ω, f = 10Hz to 10kHz | 4 | μVRMS | ||
All other devices | f = 0.1Hz to 10Hz | 1.4 | µVRMS | ||||
iN | Input current noise | RS = 20 Ω, f = 1kHz | 10 | fA/√Hz | |||
Phase margin | TL08xC, TL08xAC, TL08xBC, TL08xI | G = +1, RL = 10kΩ, CL = 20pF | 56 | ° | |||
Overload recovery time | VIN × gain > VS | 300 | ns | ||||
THD+N | Total harmonic distortion + noise | All PS and NS packages; All TL08xM devices | VO = 6VRMS, RL ≥ 2kΩ, f = 1kHz, G = +1, RS ≤ 1kΩ | 0.003 | % | ||
All other devices | VS = 40V, VO = 6VRMS, G = +1, f = 1kHz | 0.00012 | % | ||||
EMIRR | EMI rejection ratio | TL08xC, TL08xAC, TL08xBC, TL08xI | f = 1GHz | 53 | dB | ||
ZO | Open-loop output impedance | TL07xC, TL07xAC, TL07xBC, TL07xI | f = 1MHz, IO = 0 A | 125 | Ω |