SLVS610C August   2006  – October 2024

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Reference Section Electrical Characteristics
    6. 5.6  Oscillator Section Electrical Characteristics
    7. 5.7  Error-Amplifier Section Electrical Characteristics
    8. 5.8  Current-Sense Section Electrical Characteristics
    9. 5.9  Output Section Electrical Characteristics
    10. 5.10 Undervoltage-Lockout Section Electrical Characteristics
    11. 5.11 Pulse-Width Modulator Section Electrical Characteristics
    12. 5.12 Supply Voltage Electrical Characteristics
    13. 5.13 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Functional Block Diagram
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Shutdown Technique
    3. 7.3 Open-Loop Laboratory Test Fixture
    4. 7.4 Typical Application
      1. 7.4.1 Application Curves
  9. 8 Device and Documentation Support
    1. 8.1 Related Links
    2. 8.2 Trademarks
    3. 8.3 Electrostatic Discharge Caution
    4. 8.4 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.3 Open-Loop Laboratory Test Fixture

In the open-loop laboratory test fixture (see Figure 7-6), high peak currents associated with loads necessitate careful grounding techniques. Timing and bypass capacitors should be connected close to the GND terminal in a single-point ground. The transistor and 5-kΩ potentiometer sample the oscillator waveform and apply an adjustable ramp to the ISENSE terminal.

TL284xB TL384xB Open-Loop Laboratory Test FixtureFigure 7-6 Open-Loop Laboratory Test Fixture