9 Revision History
Changes from Revision I (July 2019) to Revision J (November 2023)
- Changed ESD protection specification from 2000 V per MIL-STD-883C,
method 3015.2, to 1000 V per ANSI/ESDA/JEDEC JS-001, in
Features
Go
- Changed Device Information table to Package Information, and changed
Body Size (Nom) to Package Size, in Description
sectionGo
- Added ESD Ratings table and HBM, CDM, and MM specifications.Go
- Changed thermal resistance and characterization parameter values for
SOIC and PDIP packages in Thermal Information table.Go
- Changed reset current (IRESET) test conditions to
VRESET = VDD, in Electrical Characteristics:
VDD = 5 V and Electrical Characteristics:
VDD = 15 V
Go
- Added new reset current (IRESET) typical specification,
for test condition VRESET = 0 V, to Electrical Characteristics:
VDD = 5 V and Electrical Characteristics:
VDD = 15 V
Go
- Changed supply current (IDD) typical value from 170 μA to
180 μA in Electrical Characteristics: VDD = 5
V
Go
- Changed title of Operating Characteristics section to
Timing Characteristics and clarified that values are specified by
design or characterization.Go
- Deleted Initial error of timing interval specification in Timing
Characteristics
Go
- Added Figure 5-4, Supply Current vs Supply Voltage, Unit
2
Go
- Changed Figure 5-3, Supply Current vs Supply Voltage, to add
"Unit 1" to title, and deleted 0°C and 70°C curvesGo
- Changed functional block diagram to simplified schematic and moved
to Overview
Go
- Updated Functional Block Diagram
Go
- Added guidance for RESET pin pullup resistance and CONT pin voltage range to
Monostable Operation
Go
- Added clarity regarding nominal operating frequency and parasitic
terms in Astable Operation
Go
- Deleted link to deprecated TLC555 Design Calculator in Astable
Operation
Go
- Deleted Figure 17, Equivalent Schematic, and added guidance
concerning the RESET pin in Device Functional Modes
Go
Changes from Revision H (August 2016) to Revision I (July 2019)
- Added MIN value for input voltage in Absolute Maximum Ratings
Go
- Added discharge pin in Absolute Maximum Ratings
Go
- Changed MIN supply voltage based on part number in Recommended Operating Conditions
Go
- Added power dissipation capacitance TYP value in Electrical
Characteristics: VDD = 2 V for TLC555C, VDD = 3 V for
TLC555I
Go
- Added trigger, threshold capacitance TYP value in Electrical
Characteristics: VDD = 5 V
Go
- Changed VOH test condition current to –1 mA in
Electrical Characteristics: VDD = 5 V
Go
- Added power dissipation capacitance TYP value in Electrical
Characteristics: VDD = 5 V
Go
- Added trigger, threshold capacitance TYP value in Electrical
Characteristics: VDD = 15 V
Go
- Added power dissipation capacitance TYP value in Electrical
Characteristics: VDD = 15 V
Go
- Added Operating Characteristics to the Specifications
sectionGo
- Added Supply Current vs Supply Voltage chart to the Typical Characteristics sectionGo
- Added Control Impedance vs Temperature chart to the Typical Characteristics sectionGo
- Added Output Low Resistance vs Temperature chart to the Typical Characteristics sectionGo
- Added Output High Resistance vs Temperature chart to the Typical Characteristics sectionGo
- Added Propagation Delay vs Control Voltage chart, VDD = 2 V to the Typical Characteristics sectionGo
- Added Propagation Delay vs Control Voltage chart, VDD = 5 V to the Typical Characteristics sectionGo
- Changed trigger high hold time to 1 µs in Monostable
Operation
Go
- Changed minimum monostable pulse width to 1 µs in Monostable
Operation
Go
- Changed Output Pulse Duration vs Capacitance chart scale down to 0.001 ms in
Monostable Operation
Go
- Added more astable frequency formulas to the Astable
Operation sectionGo
- Changed scale on Free-Running Frequency vs Timing Capacitance chart
up to 2 MHz in the Astable Operation sectionGo
- Added CONT pin table note to the Table 6-1, Function Table in
the Device Functional Modes
Go
- Changed the application curve chart in the Pulse-Width Modulation sectionGo
- Changed the application curve charts in the Pulse-Position Modulation sectionGo
- Added clamping diodes to Sequential Timer Circuit in the
Sequential Timer sectionGo
- Added Designing for Improved
ESD Performance section to the Application
Information sectionGo
Changes from Revision G (November 2008) to Revision H (August 2016)
- Added Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information sectionGo
- Changed values in the Thermal Information table to align with
JEDEC standards.Go
- Deleted Dissipation Ratings table Go