SBVS127E
March 2009 – July 2017
TLC5951
PRODUCTION DATA.
1
Features
2
Applications
3
Description
4
Revision History
5
Description (Continued)
6
Pin Configuration and Functions
7
Specifications
7.1
Absolute Maximum Ratings
7.2
ESD Ratings
7.3
Recommended Operating Conditions
7.4
Thermal Information
7.5
Electrical Characteristics
7.6
Switching Characteristics
7.7
Typical Characteristics
8
Parameter Measurement Information
8.1
Pin Equivalent Input and Output Schematic Diagrams
8.2
Test Circuits
9
Detailed Description
9.1
Overview
9.2
Functional Block Diagram
9.3
Feature Description
9.3.1
Thermal-Shutdown and Thermal-Error Flags
9.3.2
Noise Reduction
9.4
Device Functional Modes
9.4.1
Maximum Constant Sink-Current Value
9.4.2
Dot Correction (DC) Function
9.4.3
Global Brightness Control (BC) Function
9.4.4
Grayscale (GS) Function (PWM Control)
9.4.4.1
PWM Counter 12-Bit Mode Without Auto Repeat
9.4.4.2
PWM Counter 8-, 10-, or 12-Bit Mode Without Auto Repeat
9.4.4.3
PWM Counter 8-, 10-, or 12-Bit Mode With Auto Repeat
9.4.5
Register and Data Latch Configuration
9.4.5.1
288-Bit Common Shift Register
9.4.5.2
Grayscale Data Latch
9.4.5.3
DC, BC, FC, and UD Shift Register
9.4.5.3.1
DC, BC, FC, and UD Data Latch
9.4.5.3.2
Dot-Correction Data Latch
9.4.5.3.3
Global-Brightness Control-Data Latch
9.4.5.3.4
Function-Control Data Latch
9.4.5.3.5
User-Defined Data Latch
9.4.6
Status Information Data (SID)
9.4.7
Continuous Base LOD, LSD, and TEF
10
Device and Documentation Support
10.1
Receiving Notification of Documentation Updates
10.2
Community Resources
10.3
Trademarks
10.4
Electrostatic Discharge Caution
10.5
Glossary
11
Mechanical, Packaging, and Orderable Information
Package Options
Mechanical Data (Package|Pins)
RTA|40
MPQF134A
DAP|38
MPDS381
RHA|40
MPQF135D
Thermal pad, mechanical data (Package|Pins)
RTA|40
QFND055H
DAP|38
PPTD110D
RHA|40
QFND047R
Orderable Information
sbvs127e_oa
sbvs127e_pm
8
Parameter Measurement Information
8.1
Pin Equivalent Input and Output Schematic Diagrams
Figure 34.
GSSCK, GSLAT, DCSIN, DCSCK, GSCKR, GSCKG, GSCKB
Figure 36.
GSSOUT, DCSOUT
Figure 35.
GSSIN, XBLNK
Figure 37.
OUTR0, -G0, -B0 Through OUTR7, -G7, -B7
8.2
Test Circuits
1.
C
L
includes measurement probe and jig capacitance.
2.
X = R, G, or B; n = 0–7.
Figure 38.
Rise-Time and Fall-Time Test Circuit for OUTRn, -Gn, -Bn
1.
C
L
includes measurement probe and jig capacitance.
Figure 39.
Rise-Time and Fall-Time Test Circuit for GSSOUT and DCSOUT
1.
X = R, G, or B; n = 0–7.
Figure 40.
Constant-Current Test Circuit for OUTRn, -Gn, -Bn