SLLSEX4B August 2019 – June 2022 TLIN1028-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
DEVICE SWITCHING CHARACTERISTICS | ||||||
trx_pdr trx_pdf |
Receiver rising/falling propagation delay time (ISO/DIS 17987 Param 31) | RRXD = 2.4 kΩ, CRXD = 20 pF (See Figure 8-13, Figure 8-14 and Figure 8-18) |
6 | µs | ||
trs_sym | Symmetry of receiver propagation delay time Receiver rising propagation delay time (ISO/DIS 17987 Param 32) | Rising edge with respect to falling edge, (trx_sym = trx_pdf – trx_pdr), RRXD = 2.4 kΩ, CRXD = 20 pF (Figure 8-13, Figure 8-14 and Figure 8-18) | –2 | 2 | µs | |
tLINBUS | LIN wakeup time (minimum dominant time on LIN bus for wakeup) | See Figure 8-17, Figure 9-3 and Figure 9-4 | 25 | 100 | 150 | µs |
tCLEAR | Time to clear false wake-up prevention logic if LIN bus had a bus stuck dominant fault (recessive time on LIN bus to clear bus stuck dominant fault) | See Figure 9-4 | 8 | 17 | 50 | µs |
tTXD_DTO | Dominant state time out | 20 | 34 | 80 | ms | |
tEN | Enable pin deglitch time(1) | Time of enable pin state change before initiating mode change or sampling TXD pin: See Figure 8-15 | 3 | 12 | µs | |
tMODE_CHANGE | Mode change delay time from normal mode to sleep or standby modes | Time to change from normal mode to sleep or standby after TXD pin sampling after EN pin set low: See Figure 8-15 | 20 | µs | ||
tMODE_CHANGE | Mode change delay time from sleep mode to normal mode | Time to change from sleep mode to normal mode through EN pin and not due to a wake event; RXD pulled up to VCC: See Figure 8-15 | 400 | µs | ||
tNOMINT | Normal mode initialization time | Time for normal mode to initialize and data on RXD pin to be valid after tEN: See Figure 8-15 | 35 | µs | ||
tPWR | Power-up time | Upon power up, time it takes for nRST to go high | 2 | ms |