SBVS453 May 2024 TLV770
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
tSTR | Start-up time (VEN) | From VEN > VEN(HI) to VOUT = 95% of VOUT(NOM), VIN rise time = 1V/µs |
320 | µs |