SBOS820B September 2019 – July 2021 TMCS1100
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
The separation between the input conductor and the Hall sensor die due to the TMCS1100 construction provides inherent galvanic isolation between package pins 1-4 and pins 5-8. Insulation capability is defined according to certification agency definitions and using industry-standard test methods as defined in the Section 7.6 table. Assessment of device lifetime working voltages follow the VDE 0884-11 standard for basic insulation, requiring time-dependent dielectric breakdown (TDDB) data-projection failure rates of less than 1000 part per million (ppm), and a minimum insulation lifetime of 20 years. The VDE standard also requires an additional safety margin of 20% for working voltage, and a 30% margin for insulation lifetime, translating into a minimum required lifetime of 26 years at 509 VRMS for the TMCS1100.
Figure 9-1 shows the intrinsic capability of the isolation barrier to
withstand high-voltage stress over the lifetime of the device. Based
on the TDDB data, the intrinsic capability of these devices is 424
VRMS with a lifetime of
> 100 years. Other factors
such as operating environment and pollution degree can further limit
the working voltage of the component in an end system.