SBOSA71 July 2021 TMCS1107-Q1
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
The separation between the input conductor and the Hall sensor die due to the TMCS1107-Q1 construction provides inherent galvanic isolation between high-voltage package pins 1-4 and low-voltage package pins 5-8. Insulation capability is defined according to certification agency definitions using industry-standard test methods as defined in the Insulation Specifications table. Assessment of device lifetime working voltages follow the VDE 0884-11 standard for basic insulation, requiring time-dependent dielectric breakdown (TDDB) data-projection failure rates of less than 1000 part per million (ppm), and a minimum insulation lifetime of 20 years. Based on TDDB data, the intrinsic capability of the isolation barrier to withstand high-voltage stress indicate lifetime of the TMCS1107 is > 100 years at 297 VRMS. Other factors such as operating environment and pollution degree can further limit the working voltage of the component in an end system.