SBOSA35A January 2021 – July 2021 TMCS1107
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
The separation between the input conductor and the Hall sensor die due to the TMCS1107 construction provides inherent galvanic isolation between high-voltage package pins 1-4 and low-voltage package pins 5-8. Insulation capability is defined according to certification agency definitions using industry-standard test methods as defined in the Insulation Specifications table. Assessment of device lifetime working voltages follow the VDE 0884-11 standard for basic insulation, requiring time-dependent dielectric breakdown (TDDB) data-projection failure rates of less than 1000 part per million (ppm), and a minimum insulation lifetime of 20 years. Based on TDDB data, the intrinsic capability of the isolation barrier to withstand high-voltage stress indicate lifetime of the TMCS1107 is > 100 years at 297 VRMS. Other factors such as operating environment and pollution degree can further limit the working voltage of the component in an end system.