SPRS584Q April   2009  – January 2024 TMS320F28030 , TMS320F28030-Q1 , TMS320F28031 , TMS320F28031-Q1 , TMS320F28032 , TMS320F28032-Q1 , TMS320F28033 , TMS320F28033-Q1 , TMS320F28034 , TMS320F28034-Q1 , TMS320F28035 , TMS320F28035-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
    1. 3.1 Functional Block Diagram
  5. 4 Device Comparison
    1. 4.1 Related Products
  6. 5 Pin Configuration and Functions
    1. 5.1 Pin Diagrams
    2. 5.2 Signal Descriptions
  7. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings – Automotive
    3. 6.3  ESD Ratings – Commercial
    4. 6.4  Recommended Operating Conditions
    5. 6.5  Power Consumption Summary
      1. 6.5.1 TMS320F2803x Current Consumption at 60-MHz SYSCLKOUT
      2. 6.5.2 Reducing Current Consumption
      3. 6.5.3 Current Consumption Graphs (VREG Enabled)
    6. 6.6  Electrical Characteristics
    7. 6.7  Thermal Resistance Characteristics
      1. 6.7.1 PN Package
      2. 6.7.2 PAG Package
      3. 6.7.3 RSH Package
    8. 6.8  Thermal Design Considerations
    9. 6.9  JTAG Debug Probe Connection Without Signal Buffering for the MCU
    10. 6.10 Parameter Information
      1. 6.10.1 Timing Parameter Symbology
      2. 6.10.2 General Notes on Timing Parameters
    11. 6.11 Test Load Circuit
    12. 6.12 Power Sequencing
      1. 6.12.1 Reset ( XRS) Timing Requirements
      2. 6.12.2 Reset ( XRS) Switching Characteristics
    13. 6.13 Clock Specifications
      1. 6.13.1 Device Clock Table
        1. 6.13.1.1 2803x Clock Table and Nomenclature (60-MHz Devices)
        2. 6.13.1.2 Device Clocking Requirements/Characteristics
        3. 6.13.1.3 Internal Zero-Pin Oscillator (INTOSC1/INTOSC2) Characteristics
      2. 6.13.2 Clock Requirements and Characteristics
        1. 6.13.2.1 XCLKIN Timing Requirements – PLL Enabled
        2. 6.13.2.2 XCLKIN Timing Requirements – PLL Disabled
        3. 6.13.2.3 XCLKOUT Switching Characteristics (PLL Bypassed or Enabled)
    14. 6.14 Flash Timing
      1. 6.14.1 Flash/OTP Endurance for T Temperature Material
      2. 6.14.2 Flash/OTP Endurance for S Temperature Material
      3. 6.14.3 Flash/OTP Endurance for Q Temperature Material
      4. 6.14.4 Flash Parameters at 60-MHz SYSCLKOUT
      5. 6.14.5 Flash/OTP Access Timing
      6. 6.14.6 Flash Data Retention Duration
  8. 7 Detailed Description
    1. 7.1 Overview
      1. 7.1.1  CPU
      2. 7.1.2  Control Law Accelerator (CLA)
      3. 7.1.3  Memory Bus (Harvard Bus Architecture)
      4. 7.1.4  Peripheral Bus
      5. 7.1.5  Real-Time JTAG and Analysis
      6. 7.1.6  Flash
      7. 7.1.7  M0, M1 SARAMs
      8. 7.1.8  L0 SARAM, and L1, L2, and L3 DPSARAMs
      9. 7.1.9  Boot ROM
        1. 7.1.9.1 Emulation Boot
        2. 7.1.9.2 GetMode
        3. 7.1.9.3 Peripheral Pins Used by the Bootloader
      10. 7.1.10 Security
      11. 7.1.11 Peripheral Interrupt Expansion (PIE) Block
      12. 7.1.12 External Interrupts (XINT1–XINT3)
      13. 7.1.13 Internal Zero Pin Oscillators, Oscillator, and PLL
      14. 7.1.14 Watchdog
      15. 7.1.15 Peripheral Clocking
      16. 7.1.16 Low-power Modes
      17. 7.1.17 Peripheral Frames 0, 1, 2, 3 (PFn)
      18. 7.1.18 General-Purpose Input/Output (GPIO) Multiplexer
      19. 7.1.19 32-Bit CPU-Timers (0, 1, 2)
      20. 7.1.20 Control Peripherals
      21. 7.1.21 Serial Port Peripherals
    2. 7.2 Memory Maps
    3. 7.3 Register Maps
    4. 7.4 Device Emulation Registers
    5. 7.5 VREG/BOR/POR
      1. 7.5.1 On-chip Voltage Regulator (VREG)
        1. 7.5.1.1 Using the On-chip VREG
        2. 7.5.1.2 Disabling the On-chip VREG
      2. 7.5.2 On-chip Power-On Reset (POR) and Brown-Out Reset (BOR) Circuit
    6. 7.6 System Control
      1. 7.6.1 Internal Zero Pin Oscillators
      2. 7.6.2 Crystal Oscillator Option
      3. 7.6.3 PLL-Based Clock Module
      4. 7.6.4 Loss of Input Clock (NMI Watchdog Function)
      5. 7.6.5 CPU Watchdog Module
    7. 7.7 Low-power Modes Block
    8. 7.8 Interrupts
      1. 7.8.1 External Interrupts
        1. 7.8.1.1 External Interrupt Electrical Data/Timing
          1. 7.8.1.1.1 External Interrupt Timing Requirements
          2. 7.8.1.1.2 External Interrupt Switching Characteristics
    9. 7.9 Peripherals
      1. 7.9.1  Control Law Accelerator (CLA) Overview
      2. 7.9.2  Analog Block
        1. 7.9.2.1 Analog-to-Digital Converter (ADC)
          1. 7.9.2.1.1 Features
          2. 7.9.2.1.2 ADC Start-of-Conversion Electrical Data/Timing
            1. 7.9.2.1.2.1 External ADC Start-of-Conversion Switching Characteristics
          3. 7.9.2.1.3 On-Chip Analog-to-Digital Converter (ADC) Electrical Data/Timing
            1. 7.9.2.1.3.1 ADC Electrical Characteristics
            2. 7.9.2.1.3.2 ADC Power Modes
            3. 7.9.2.1.3.3 Internal Temperature Sensor
              1. 7.9.2.1.3.3.1 Temperature Sensor Coefficient
            4. 7.9.2.1.3.4 ADC Power-Up Control Bit Timing
              1. 7.9.2.1.3.4.1 ADC Power-Up Delays
            5. 7.9.2.1.3.5 ADC Sequential and Simultaneous Timings
        2. 7.9.2.2 ADC MUX
        3. 7.9.2.3 Comparator Block
          1. 7.9.2.3.1 On-Chip Comparator/DAC Electrical Data/Timing
            1. 7.9.2.3.1.1 Electrical Characteristics of the Comparator/DAC
      3. 7.9.3  Detailed Descriptions
      4. 7.9.4  Serial Peripheral Interface (SPI) Module
        1. 7.9.4.1 SPI Master Mode Electrical Data/Timing
          1. 7.9.4.1.1 SPI Master Mode External Timing (Clock Phase = 0)
          2. 7.9.4.1.2 SPI Master Mode External Timing (Clock Phase = 1)
        2. 7.9.4.2 SPI Slave Mode Electrical Data/Timing
          1. 7.9.4.2.1 SPI Slave Mode External Timing (Clock Phase = 0)
          2. 7.9.4.2.2 SPI Slave Mode External Timing (Clock Phase = 1)
      5. 7.9.5  Serial Communications Interface (SCI) Module
      6. 7.9.6  Local Interconnect Network (LIN)
      7. 7.9.7  Enhanced Controller Area Network (eCAN) Module
      8. 7.9.8  Inter-Integrated Circuit (I2C)
        1. 7.9.8.1 I2C Electrical Data/Timing
          1. 7.9.8.1.1 I2C Timing Requirements
          2. 7.9.8.1.2 I2C Switching Characteristics
      9. 7.9.9  Enhanced PWM Modules (ePWM1/2/3/4/5/6/7)
        1. 7.9.9.1 ePWM Electrical Data/Timing
          1. 7.9.9.1.1 ePWM Timing Requirements
          2. 7.9.9.1.2 ePWM Switching Characteristics
        2. 7.9.9.2 Trip-Zone Input Timing
          1. 7.9.9.2.1 Trip-Zone Input Timing Requirements
      10. 7.9.10 High-Resolution PWM (HRPWM)
        1. 7.9.10.1 HRPWM Electrical Data/Timing
          1. 7.9.10.1.1 High-Resolution PWM Characteristics
      11. 7.9.11 Enhanced Capture Module (eCAP1)
        1. 7.9.11.1 eCAP Electrical Data/Timing
          1. 7.9.11.1.1 Enhanced Capture (eCAP) Timing Requirement
          2. 7.9.11.1.2 eCAP Switching Characteristics
      12. 7.9.12 High-Resolution Capture (HRCAP) Module
        1. 7.9.12.1 HRCAP Electrical Data/Timing
          1. 7.9.12.1.1 High-Resolution Capture (HRCAP) Timing Requirements
      13. 7.9.13 Enhanced Quadrature Encoder Pulse (eQEP)
        1. 7.9.13.1 eQEP Electrical Data/Timing
          1. 7.9.13.1.1 Enhanced Quadrature Encoder Pulse (eQEP) Timing Requirements
          2. 7.9.13.1.2 eQEP Switching Characteristics
      14. 7.9.14 JTAG Port
      15. 7.9.15 General-Purpose Input/Output (GPIO) MUX
        1. 7.9.15.1 GPIO Electrical Data/Timing
          1. 7.9.15.1.1 GPIO - Output Timing
            1. 7.9.15.1.1.1 General-Purpose Output Switching Characteristics
          2. 7.9.15.1.2 GPIO - Input Timing
            1. 7.9.15.1.2.1 General-Purpose Input Timing Requirements
          3. 7.9.15.1.3 Sampling Window Width for Input Signals
          4. 7.9.15.1.4 Low-Power Mode Wakeup Timing
            1. 7.9.15.1.4.1 IDLE Mode Timing Requirements
            2. 7.9.15.1.4.2 IDLE Mode Switching Characteristics
            3. 7.9.15.1.4.3 STANDBY Mode Timing Requirements
            4. 7.9.15.1.4.4 STANDBY Mode Switching Characteristics
            5. 7.9.15.1.4.5 HALT Mode Timing Requirements
            6. 7.9.15.1.4.6 HALT Mode Switching Characteristics
  9. 8 Applications, Implementation, and Layout
    1. 8.1 TI Reference Design
  10. 9 Device and Documentation Support
    1. 9.1 Device and Development Support Tool Nomenclature
    2. 9.2 Tools and Software
    3. 9.3 Documentation Support
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information
    1. 11.1 Packaging Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.1.10 Security

The devices support high levels of security to protect the user firmware from being reverse engineered. The security features a 128-bit password (hardcoded for 16 wait states), which the user programs into the flash. One code security module (CSM) is used to protect the flash/OTP and the L0/L1 SARAM blocks. The security feature prevents unauthorized users from examining the memory contents through the JTAG port or trying to boot-load some undesirable software that would export the secure memory contents. To enable access to the secure blocks, the user must write the correct 128-bit KEY value that matches the value stored in the password locations within the Flash.

In addition to the CSM, the emulation code security logic (ECSL) has been implemented to prevent unauthorized users from stepping through secure code. Any code or data access to flash, user OTP, or Lx memory while the JTAG debug probe is connected will trip the ECSL and break the debug probe connection. To allow debug of secure code, while maintaining the CSM protection against secure memory reads, the user must write the correct value into the lower 64 bits of the KEY register (KEY0–KEY3), which matches the value stored in the lower 64 bits of the password locations (PWL0–PWL3) within the flash. Dummy reads of all 128 bits of the password in the flash must still be performed. If the lower 64 bits of the password locations are all ones (unprogrammed), then the KEY value does not need to match. During debug of secure code, operations like single-stepping is possible. However, the actual contents of the secure memory cannot be seen in the CCS window.

When power is applied to a secure device that is connected to a JTAG debug probe, the CPU will start executing and may execute an instruction that performs an access to a protected area. If this happens, the ECSL will trip and cause the JTAG circuitry to be deactivated. Under this condition, a host (such as a computer running CCS or flash programing software) would not be able to establish connection with the device.

The solution is to use the Wait boot option. In this mode, code loops around a software breakpoint to allow a JTAG debug probe to be connected without tripping security. The user can then exit this mode once the JTAG debug probe is connected by using one of the emulation boot options as described in the Boot ROM chapter in the TMS320F2803x Real-Time Microcontrollers Technical Reference Manual. These devices do not support a hardware wait-in-reset mode.

If reprogramming of a secure device via JTAG is desired, it is important to put in the needed hooks in the board design to be able to put the device in Wait boot mode upon power-up. Otherwise, ECSL may deactivate the JTAG circuitry and prevent connection to the device, as mentioned earlier.

Note:
  • When the code-security passwords are programmed, all addresses from 0x3F7F80 to 0x3F7FF5 cannot be used as program code or data. These locations must be programmed to 0x0000.
  • If reprogramming of a secure device via JTAG may be needed in future, it is important to design the board in such a way that the device could be put in Wait boot mode upon power-up (when reprogramming is warranted). Otherwise, ECSL may deactivate the JTAG circuitry and prevent connection to the device, as mentioned earlier. If reconfiguring the device for Wait boot mode in the field is not practical, some mechanism must be implemented in the firmware to detect when a firmware update is warranted. Code could then branch to the desired bootloader in the bootROM. It could also branch to the Wait bootmode, at which point the JTAG debug probe could be connected, device unsecured and programming accomplished through JTAG itself.
  • If the code security feature is not used, addresses 0x3F7F80 to 0x3F7FEF may be used for code or data. Addresses 0x3F7FF0 to 0x3F7FF5 are reserved for data and should not contain program code.

The 128-bit password (at 0x3F 7FF8 to 0x3F 7FFF) must not be programmed to zeros. Doing so would permanently lock the device.

Code Security Module Disclaimer:

THE CODE SECURITY MODULE (CSM) INCLUDED ON THIS DEVICE WAS DESIGNED TO PASSWORD PROTECT THE DATA STORED IN THE ASSOCIATED MEMORY (EITHER ROM OR FLASH) AND IS WARRANTED BY TEXAS INSTRUMENTS (TI), IN ACCORDANCE WITH ITS STANDARD TERMS AND CONDITIONS, TO CONFORM TO TI'S PUBLISHED SPECIFICATIONS FOR THE WARRANTY PERIOD APPLICABLE FOR THIS DEVICE.

TI DOES NOT, HOWEVER, WARRANT OR REPRESENT THAT THE CSM CANNOT BE COMPROMISED OR BREACHED OR THAT THE DATA STORED IN THE ASSOCIATED MEMORY CANNOT BE ACCESSED THROUGH OTHER MEANS. MOREOVER, EXCEPT AS SET FORTH ABOVE, TI MAKES NO WARRANTIES OR REPRESENTATIONS CONCERNING THE CSM OR OPERATION OF THIS DEVICE, INCLUDING ANY IMPLIED WARRANTIES OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE.

IN NO EVENT SHALL TI BE LIABLE FOR ANY CONSEQUENTIAL, SPECIAL, INDIRECT, INCIDENTAL, OR PUNITIVE DAMAGES, HOWEVER CAUSED, ARISING IN ANY WAY OUT OF YOUR USE OF THE CSM OR THIS DEVICE, WHETHER OR NOT TI HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. EXCLUDED DAMAGES INCLUDE, BUT ARE NOT LIMITED TO LOSS OF DATA, LOSS OF GOODWILL, LOSS OF USE OR INTERRUPTION OF BUSINESS OR OTHER ECONOMIC LOSS.