SPRSP25A June   2018  – July 2018 TMS320F28035-EP

PRODUCTION DATA.  

  1. 1Device Overview
    1. 1.1 Features
    2. 1.2 Applications
    3. 1.3 Description
    4. 1.4 Functional Block Diagram
  2. 2Revision History
  3. 3Terminal Configuration and Functions
    1. 3.1 Pin Diagram
    2. 3.2 Signal Descriptions
      1. Table 3-1 Signal Descriptions
  4. 4Specifications
    1. 4.1  Absolute Maximum Ratings
    2. 4.2  ESD Ratings
    3. 4.3  Power-On Hours (POH) Limits
    4. 4.4  Recommended Operating Conditions
    5. 4.5  Power Consumption Summary
      1. Table 4-1 TMS320F2803x Current Consumption at 60-MHz SYSCLKOUT
      2. 4.5.1      Reducing Current Consumption
      3. 4.5.2      Current Consumption Graphs (VREG Enabled)
    6. 4.6  Electrical Characteristics
    7. 4.7  Thermal Resistance Characteristics
    8. 4.8  Thermal Design Considerations
    9. 4.9  Emulator Connection Without Signal Buffering for the MCU
    10. 4.10 Parameter Information
      1. 4.10.1 Timing Parameter Symbology
      2. 4.10.2 General Notes on Timing Parameters
    11. 4.11 Test Load Circuit
    12. 4.12 Power Sequencing
      1. Table 4-4 Reset (XRS) Timing Requirements
      2. Table 4-5 Reset (XRS) Switching Characteristics
    13. 4.13 Clock Specifications
      1. 4.13.1 Device Clock Table
        1. Table 4-6 2803x Clock Table and Nomenclature (60-MHz Devices)
        2. Table 4-7 Device Clocking Requirements/Characteristics
        3. Table 4-8 Internal Zero-Pin Oscillator (INTOSC1/INTOSC2) Characteristics
      2. 4.13.2 Clock Requirements and Characteristics
        1. Table 4-9   XCLKIN Timing Requirements – PLL Enabled
        2. Table 4-10 XCLKIN Timing Requirements – PLL Disabled
        3. Table 4-11 XCLKOUT Switching Characteristics (PLL Bypassed or Enabled)
    14. 4.14 Flash Timing
      1. Table 4-12 Flash/OTP Endurance
      2. Table 4-13 Flash Parameters at 60-MHz SYSCLKOUT
      3. Table 4-14 Flash/OTP Access Timing
      4. Table 4-15 Flash Data Retention Duration
  5. 5Detailed Description
    1. 5.1 Overview
      1. 5.1.1  CPU
      2. 5.1.2  Control Law Accelerator (CLA)
      3. 5.1.3  Memory Bus (Harvard Bus Architecture)
      4. 5.1.4  Peripheral Bus
      5. 5.1.5  Real-Time JTAG and Analysis
      6. 5.1.6  Flash
      7. 5.1.7  M0, M1 SARAMs
      8. 5.1.8  L0 SARAM, and L1, L2, and L3 DPSARAMs
      9. 5.1.9  Boot ROM
        1. 5.1.9.1 Emulation Boot
        2. 5.1.9.2 GetMode
        3. 5.1.9.3 Peripheral Pins Used by the Bootloader
      10. 5.1.10 Security
      11. 5.1.11 Peripheral Interrupt Expansion (PIE) Block
      12. 5.1.12 External Interrupts (XINT1–XINT3)
      13. 5.1.13 Internal Zero Pin Oscillators, Oscillator, and PLL
      14. 5.1.14 Watchdog
      15. 5.1.15 Peripheral Clocking
      16. 5.1.16 Low-power Modes
      17. 5.1.17 Peripheral Frames 0, 1, 2, 3 (PFn)
      18. 5.1.18 General-Purpose Input/Output (GPIO) Multiplexer
      19. 5.1.19 32-Bit CPU-Timers (0, 1, 2)
      20. 5.1.20 Control Peripherals
      21. 5.1.21 Serial Port Peripherals
    2. 5.2 Memory Maps
    3. 5.3 Register Maps
    4. 5.4 Device Emulation Registers
    5. 5.5 VREG/BOR/POR
      1. 5.5.1 On-chip Voltage Regulator (VREG)
        1. 5.5.1.1 Using the On-chip VREG
        2. 5.5.1.2 Disabling the On-chip VREG
      2. 5.5.2 On-chip Power-On Reset (POR) and Brown-Out Reset (BOR) Circuit
    6. 5.6 System Control
      1. 5.6.1 Internal Zero Pin Oscillators
      2. 5.6.2 Crystal Oscillator Option
      3. 5.6.3 PLL-Based Clock Module
      4. 5.6.4 Loss of Input Clock (NMI Watchdog Function)
      5. 5.6.5 CPU-Watchdog Module
    7. 5.7 Low-Power Modes Block
    8. 5.8 Interrupts
      1. 5.8.1 External Interrupts
        1. 5.8.1.1 External Interrupt Electrical Data/Timing
          1. Table 5-20 External Interrupt Timing Requirements
          2. Table 5-21 External Interrupt Switching Characteristics
    9. 5.9 Peripherals
      1. 5.9.1  Control Law Accelerator (CLA) Overview
      2. 5.9.2  Analog Block
        1. 5.9.2.1 Analog-to-Digital Converter (ADC)
          1. 5.9.2.1.1 Features
          2. 5.9.2.1.2 ADC Start-of-Conversion Electrical Data/Timing
            1. Table 5-26 External ADC Start-of-Conversion Switching Characteristics
          3. 5.9.2.1.3 On-Chip Analog-to-Digital Converter (ADC) Electrical Data/Timing
            1. Table 5-27 ADC Electrical Characteristics
            2. Table 5-28 ADC Power Modes
            3. 5.9.2.1.3.1 Internal Temperature Sensor
              1. Table 5-29 Temperature Sensor Coefficient
            4. 5.9.2.1.3.2 ADC Power-Up Control Bit Timing
              1. Table 5-30 ADC Power-Up Delays
            5. 5.9.2.1.3.3 ADC Sequential and Simultaneous Timings
        2. 5.9.2.2 ADC MUX
        3. 5.9.2.3 Comparator Block
          1. 5.9.2.3.1 On-Chip Comparator/DAC Electrical Data/Timing
            1. Table 5-32 Electrical Characteristics of the Comparator/DAC
      3. 5.9.3  Detailed Descriptions
      4. 5.9.4  Serial Peripheral Interface (SPI) Module
        1. 5.9.4.1 SPI Master Mode Electrical Data/Timing
          1. Table 5-35 SPI Master Mode External Timing (Clock Phase = 0)
          2. Table 5-36 SPI Master Mode External Timing (Clock Phase = 1)
        2. 5.9.4.2 SPI Slave Mode Electrical Data/Timing
          1. Table 5-37 SPI Slave Mode External Timing (Clock Phase = 0)
          2. Table 5-38 SPI Slave Mode External Timing (Clock Phase = 1)
      5. 5.9.5  Serial Communications Interface (SCI) Module
      6. 5.9.6  Local Interconnect Network (LIN)
      7. 5.9.7  Enhanced Controller Area Network (eCAN) Module
      8. 5.9.8  Inter-Integrated Circuit (I2C)
        1. 5.9.8.1 I2C Electrical Data/Timing
          1. Table 5-44 I2C Timing Requirements
          2. Table 5-45 I2C Switching Characteristics
      9. 5.9.9  Enhanced PWM Modules (ePWM1/2/3/4/5/6/7)
        1. 5.9.9.1 ePWM Electrical Data/Timing
          1. Table 5-48 ePWM Timing Requirements
          2. Table 5-49 ePWM Switching Characteristics
        2. 5.9.9.2 Trip-Zone Input Timing
          1. Table 5-50 Trip-Zone Input Timing Requirements
      10. 5.9.10 High-Resolution PWM (HRPWM)
        1. 5.9.10.1 HRPWM Electrical Data/Timing
          1. Table 5-51 High-Resolution PWM Characteristics
      11. 5.9.11 Enhanced Capture Module (eCAP1)
        1. 5.9.11.1 eCAP Electrical Data/Timing
          1. Table 5-53 Enhanced Capture (eCAP) Timing Requirement
          2. Table 5-54 eCAP Switching Characteristics
      12. 5.9.12 High-Resolution Capture (HRCAP) Module
        1. 5.9.12.1 HRCAP Electrical Data/Timing
          1. Table 5-56 High-Resolution Capture (HRCAP) Timing Requirements
      13. 5.9.13 Enhanced Quadrature Encoder Pulse (eQEP)
        1. 5.9.13.1 eQEP Electrical Data/Timing
          1. Table 5-58 Enhanced Quadrature Encoder Pulse (eQEP) Timing Requirements
          2. Table 5-59 eQEP Switching Characteristics
      14. 5.9.14 JTAG Port
      15. 5.9.15 General-Purpose Input/Output (GPIO) MUX
        1. 5.9.15.1 GPIO Electrical Data/Timing
          1. 5.9.15.1.1 GPIO - Output Timing
            1. Table 5-63 General-Purpose Output Switching Characteristics
          2. 5.9.15.1.2 GPIO - Input Timing
            1. Table 5-64 General-Purpose Input Timing Requirements
          3. 5.9.15.1.3 Sampling Window Width for Input Signals
          4. 5.9.15.1.4 Low-Power Mode Wakeup Timing
            1. Table 5-65 IDLE Mode Timing Requirements
            2. Table 5-66 IDLE Mode Switching Characteristics
            3. Table 5-67 STANDBY Mode Timing Requirements
            4. Table 5-68 STANDBY Mode Switching Characteristics
            5. Table 5-69 HALT Mode Timing Requirements
            6. Table 5-70 HALT Mode Switching Characteristics
  6. 6Applications, Implementation, and Layout
    1. 6.1 TI Design or Reference Design
  7. 7Device and Documentation Support
    1. 7.1 Getting Started
    2. 7.2 Device and Development Support Tool Nomenclature
    3. 7.3 Tools and Software
    4. 7.4 Documentation Support
    5. 7.5 Community Resources
    6. 7.6 Trademarks
    7. 7.7 Electrostatic Discharge Caution
    8. 7.8 Glossary
  8. 8Mechanical, Packaging, and Orderable Information
    1. 8.1 Packaging Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

4.3 Power-On Hours (POH) Limits(1)

NOMINAL VCC VOLTAGE (V) JUNCTION TEMPERATURE (TJ) LIFETIME POH(2)
1.2 105°C 100k
125°C 25k
(1) This information is provided solely for your convenience and does not extend or modify the warranty provided under TI's standard terms and conditions for TI semiconductor products.
(2) POH represents device operation under the specified nominal conditions continuously for the duration of the calculated lifetime.
TMS320F28035-EP D001-operating-life-derating.gif
1. Silicon operating life design goal is 100000 power-on hours (POH) at 105°C junction temperature (does not include package interconnect life).
2. The predicted operating lifetime versus junction temperature is based on reliability modeling using electromigration as the dominant failure mechanism affecting device wear out for the specific device process and design characteristics.
Figure 4-1 TMS320F28035-EP Operating Life Derating Chart