SPRS881K August 2014 – February 2024 TMS320F28374S , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376S , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378S , TMS320F28379S
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
Based on the end application design and operational profile, the IDD and IDDIO currents could vary. Systems that exceed the recommended maximum power dissipation in the end product may require additional thermal enhancements. Ambient temperature (TA) varies with the end application and product design. The critical factor that affects reliability and functionality is TJ, the junction temperature, not the ambient temperature. Hence, care should be taken to keep TJ within the specified limits. Tcase should be measured to estimate the operating junction temperature TJ. Tcase is normally measured at the center of the package top-side surface. The thermal application report Semiconductor and IC Package Thermal Metrics helps to understand the thermal metrics and definitions.