5.2 Die-ID Registers
The two registers (DIEIDL and DIEIDH) form a 64-bit number that contains information about the device’s die lot number, wafer number and X, Y wafer coordinates. The die identification information will vary from unit to unit. This information is programmed by TI as part of the initial device test procedure. The data format of the Die-ID registers is shown here.
Figure 5-2 DIEIDL Register (Location: 0xFFFF FF7C)
31 |
30 |
29 |
28 |
27 |
26 |
25 |
24 |
23 |
22 |
21 |
20 |
19 |
18 |
17 |
16 |
LOT (LOWER 10 BITS) |
WAFER # |
15 |
14 |
13 |
12 |
11 |
10 |
9 |
8 |
7 |
6 |
5 |
4 |
3 |
2 |
1 |
0 |
Y WAFER COORDINATES |
X WAFER COORDINATES |
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset; D= device dependent |
Figure 5-3 DIEIDH Register (Location: 0xFFFF FF80)
31 |
30 |
29 |
28 |
27 |
26 |
25 |
24 |
23 |
22 |
21 |
20 |
19 |
18 |
17 |
16 |
15 |
14 |
13 |
12 |
11 |
10 |
9 |
8 |
7 |
6 |
5 |
4 |
3 |
2 |
1 |
0 |
RESERVED |
LOT # (UPPER 14 BITS) |
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset; D= device dependent |