SPNS164C April   2012  – April 2015 TMS570LS2125 , TMS570LS2135 , TMS570LS3135

PRODUCTION DATA.  

  1. 1Device Overview
    1. 1.1 Features
    2. 1.2 Applications
    3. 1.3 Description
    4. 1.4 Functional Block Diagram
  2. 2Revision History
  3. 3Device Comparison
  4. 4Terminal Configuration and Functions
    1. 4.1 PGE QFP Package Pinout (144-Pin)
    2. 4.2 ZWT BGA Package Ball-Map (337-Ball Grid Array)
    3. 4.3 Terminal Functions
      1. 4.3.1 PGE Package
        1. 4.3.1.1  Multibuffered Analog-to-Digital Converters (MibADCs)
        2. 4.3.1.2  Enhanced High-End Timer (N2HET) Modules
        3. 4.3.1.3  General-Purpose Input/Output (GPIO)
        4. 4.3.1.4  FlexRay Interface Controller (FlexRay)
        5. 4.3.1.5  Controller Area Network Controllers (DCANs)
        6. 4.3.1.6  Local Interconnect Network Interface Module (LIN)
        7. 4.3.1.7  Standard Serial Communication Interface (SCI)
        8. 4.3.1.8  Inter-Integrated Circuit Interface Module (I2C)
        9. 4.3.1.9  Standard Serial Peripheral Interface (SPI)
        10. 4.3.1.10 Multibuffered Serial Peripheral Interface Modules (MibSPI)
        11. 4.3.1.11 System Module Interface
        12. 4.3.1.12 Clock Inputs and Outputs
        13. 4.3.1.13 Test and Debug Modules Interface
        14. 4.3.1.14 Flash Supply and Test Pads
        15. 4.3.1.15 Supply for Core Logic: 1.2-V Nominal
        16. 4.3.1.16 Supply for I/O Cells: 3.3-V Nominal
        17. 4.3.1.17 Ground Reference for All Supplies Except VCCAD
      2. 4.3.2 ZWT Package
        1. 4.3.2.1  Multibuffered Analog-to-Digital Converters (MibADCs)
        2. 4.3.2.2  Enhanced High-End Timer (N2HET) Modules
        3. 4.3.2.3  General-Purpose Input/Output (GPIO)
        4. 4.3.2.4  FlexRay Interface Controller (FlexRay)
        5. 4.3.2.5  Controller Area Network Controllers (DCANs)
        6. 4.3.2.6  Local Interconnect Network Interface Module (LIN)
        7. 4.3.2.7  Standard Serial Communication Interface (SCI)
        8. 4.3.2.8  Inter-Integrated Circuit Interface Module (I2C)
        9. 4.3.2.9  Standard Serial Peripheral Interface (SPI)
        10. 4.3.2.10 Multibuffered Serial Peripheral Interface Modules (MibSPI)
        11. 4.3.2.11 External Memory Interface (EMIF)
        12. 4.3.2.12 Embedded Trace Macrocell for Cortex-R4F CPU (ETM-R4F)
        13. 4.3.2.13 RAM Trace Port (RTP)
        14. 4.3.2.14 Data Modification Module (DMM)
        15. 4.3.2.15 System Module Interface
        16. 4.3.2.16 Clock Inputs and Outputs
        17. 4.3.2.17 Test and Debug Modules Interface
        18. 4.3.2.18 Flash Supply and Test Pads
        19. 4.3.2.19 No Connects
        20. 4.3.2.20 Supply for Core Logic: 1.2-V Nominal
        21. 4.3.2.21 Supply for I/O Cells: 3.3-V Nominal
        22. 4.3.2.22 Ground Reference for All Supplies Except VCCAD
  5. 5Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Power-On Hours (POH)
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Switching Characteristics for Clock Domains
    6. 5.6  Wait States Required
    7. 5.7  Power Consumption
    8. 5.8  Input/Output Electrical Characteristics
    9. 5.9  Thermal Resistance Characteristics
    10. 5.10 Output Buffer Drive Strengths
    11. 5.11 Input Timings
    12. 5.12 Output Timings
    13. 5.13 Low-EMI Output Buffers
  6. 6System Information and Electrical Specifications
    1. 6.1  Device Power Domains
    2. 6.2  Voltage Monitor Characteristics
      1. 6.2.1 Important Considerations
      2. 6.2.2 Voltage Monitor Operation
      3. 6.2.3 Supply Filtering
    3. 6.3  Power Sequencing and Power On Reset
      1. 6.3.1 Power-Up Sequence
      2. 6.3.2 Power-Down Sequence
      3. 6.3.3 Power-On Reset: nPORRST
        1. 6.3.3.1 nPORRST Electrical and Timing Requirements
    4. 6.4  Warm Reset (nRST)
      1. 6.4.1 Causes of Warm Reset
      2. 6.4.2 nRST Timing Requirements
    5. 6.5  ARM-R4F CPU Information
      1. 6.5.1 Summary of ARM Cortex-R4F CPU Features
      2. 6.5.2 ARM Cortex-R4F CPU Features Enabled by Software
      3. 6.5.3 Dual Core Implementation
      4. 6.5.4 Duplicate Clock Tree After GCLK
      5. 6.5.5 ARM Cortex-R4F CPU Compare Module (CCM-R4) for Safety
      6. 6.5.6 CPU Self-Test
        1. 6.5.6.1 Application Sequence for CPU Self-Test
        2. 6.5.6.2 CPU Self-Test Clock Configuration
        3. 6.5.6.3 CPU Self-Test Coverage
    6. 6.6  Clocks
      1. 6.6.1 Clock Sources
        1. 6.6.1.1 Main Oscillator
          1. 6.6.1.1.1 Timing Requirements for Main Oscillator
        2. 6.6.1.2 Low Power Oscillator
          1. 6.6.1.2.1 Features
          2. 6.6.1.2.2 LPO Electrical and Timing Specifications
        3. 6.6.1.3 Phase Locked Loop (PLL) Clock Modules
          1. 6.6.1.3.1 Block Diagram
          2. 6.6.1.3.2 PLL Timing Specifications
        4. 6.6.1.4 External Clock Inputs
      2. 6.6.2 Clock Domains
        1. 6.6.2.1 Clock Domain Descriptions
        2. 6.6.2.2 Mapping of Clock Domains to Device Modules
      3. 6.6.3 Clock Test Mode
    7. 6.7  Clock Monitoring
      1. 6.7.1 Clock Monitor Timings
      2. 6.7.2 External Clock (ECLK) Output Functionality
      3. 6.7.3 Dual Clock Comparators
        1. 6.7.3.1 Features
        2. 6.7.3.2 Mapping of DCC Clock Source Inputs
    8. 6.8  Glitch Filters
    9. 6.9  Device Memory Map
      1. 6.9.1 Memory Map Diagram
      2. 6.9.2 Memory Map Table
      3. 6.9.3 Master/Slave Access Privileges
        1. 6.9.3.1 Special Notes on Accesses to Certain Slaves
      4. 6.9.4 POM Overlay Considerations
    10. 6.10 Flash Memory
      1. 6.10.1 Flash Memory Configuration
      2. 6.10.2 Main Features of Flash Module
      3. 6.10.3 ECC Protection for Flash Accesses
      4. 6.10.4 Flash Access Speeds
      5. 6.10.5 Flash Program and Erase Timings for Program Flash
      6. 6.10.6 Flash Program and Erase Timings for Data Flash
    11. 6.11 Tightly Coupled RAM (TCRAM) Interface Module
      1. 6.11.1 Features
      2. 6.11.2 TCRAM Interface ECC Support
    12. 6.12 Parity Protection for Peripheral RAMs
    13. 6.13 On-Chip SRAM Initialization and Testing
      1. 6.13.1 On-Chip SRAM Self-Test Using PBIST
        1. 6.13.1.1 Features
        2. 6.13.1.2 PBIST RAM Groups
      2. 6.13.2 On-Chip SRAM Auto Initialization
    14. 6.14 External Memory Interface (EMIF)
      1. 6.14.1 Features
      2. 6.14.2 Electrical and Timing Specifications
        1. 6.14.2.1 Asynchronous RAM
        2. 6.14.2.2 Synchronous Timing
    15. 6.15 Vectored Interrupt Manager
      1. 6.15.1 VIM Features
      2. 6.15.2 Interrupt Request Assignments
    16. 6.16 DMA Controller
      1. 6.16.1 DMA Features
      2. 6.16.2 Default DMA Request Map
    17. 6.17 Real Time Interrupt Module
      1. 6.17.1 Features
      2. 6.17.2 Block Diagrams
      3. 6.17.3 Clock Source Options
      4. 6.17.4 Network Time Synchronization Inputs
    18. 6.18 Error Signaling Module
      1. 6.18.1 Features
      2. 6.18.2 ESM Channel Assignments
    19. 6.19 Reset / Abort / Error Sources
    20. 6.20 Digital Windowed Watchdog
    21. 6.21 Debug Subsystem
      1. 6.21.1  Block Diagram
      2. 6.21.2  Debug Components Memory Map
      3. 6.21.3  JTAG Identification Code
      4. 6.21.4  Debug ROM
      5. 6.21.5  JTAG Scan Interface Timings
      6. 6.21.6  Advanced JTAG Security Module
      7. 6.21.7  Embedded Trace Macrocell (ETM-R4)
        1. 6.21.7.1 ETM TRACECLKIN Selection
        2. 6.21.7.2 Timing Specifications
      8. 6.21.8  RAM Trace Port (RTP)
        1. 6.21.8.1 Features
        2. 6.21.8.2 Timing Specifications
      9. 6.21.9  Data Modification Module (DMM)
        1. 6.21.9.1 Features
        2. 6.21.9.2 Timing Specifications
      10. 6.21.10 Boundary Scan Chain
  7. 7Peripheral Information and Electrical Specifications
    1. 7.1  Peripheral Legend
    2. 7.2  Multibuffered 12-Bit Analog-to-Digital Converter
      1. 7.2.1 Features
      2. 7.2.2 Event Trigger Options
        1. 7.2.2.1 Default MIBADC1 Event Trigger Hookup
        2. 7.2.2.2 Alternate MIBADC1 Event Trigger Hookup
        3. 7.2.2.3 Default MIBADC2 Event Trigger Hookup
        4. 7.2.2.4 Alternate MIBADC2 Event Trigger Hookup
      3. 7.2.3 ADC Electrical and Timing Specifications
      4. 7.2.4 Performance (Accuracy) Specifications
        1. 7.2.4.1 MibADC Nonlinearity Errors
        2. 7.2.4.2 MibADC Total Error
    3. 7.3  General-Purpose Input/Output
      1. 7.3.1 Features
    4. 7.4  Enhanced High-End Timer (N2HET)
      1. 7.4.1 Features
      2. 7.4.2 N2HET RAM Organization
      3. 7.4.3 Input Timing Specifications
      4. 7.4.4 N2HET1-N2HET2 Interconnections
      5. 7.4.5 N2HET Checking
        1. 7.4.5.1 Internal Monitoring
        2. 7.4.5.2 Output Monitoring Using Dual Clock Comparator (DCC)
      6. 7.4.6 Disabling N2HET Outputs
      7. 7.4.7 High-End Timer Transfer Unit (HTU)
        1. 7.4.7.1 Features
        2. 7.4.7.2 Trigger Connections
    5. 7.5  FlexRay Interface
      1. 7.5.1 Features
      2. 7.5.2 Electrical and Timing Specifications
      3. 7.5.3 FlexRay Transfer Unit
    6. 7.6  Controller Area Network (DCAN)
      1. 7.6.1 Features
      2. 7.6.2 Electrical and Timing Specifications
    7. 7.7  Local Interconnect Network Interface (LIN)
      1. 7.7.1 LIN Features
    8. 7.8  Serial Communication Interface (SCI)
      1. 7.8.1 Features
    9. 7.9  Inter-Integrated Circuit (I2C)
      1. 7.9.1 Features
      2. 7.9.2 I2C I/O Timing Specifications
    10. 7.10 Multibuffered / Standard Serial Peripheral Interface
      1. 7.10.1 Features
      2. 7.10.2 MibSPI Transmit and Receive RAM Organization
      3. 7.10.3 MibSPI Transmit Trigger Events
        1. 7.10.3.1 MIBSPI1 Event Trigger Hookup
        2. 7.10.3.2 MIBSPI3 Event Trigger Hookup
        3. 7.10.3.3 MIBSPI5 Event Trigger Hookup
      4. 7.10.4 MibSPI/SPI Master Mode I/O Timing Specifications
      5. 7.10.5 SPI Slave Mode I/O Timings
  8. 8Device and Documentation Support
    1. 8.1  Device Support
      1. 8.1.1 Development Support
      2. 8.1.2 Device Nomenclature
    2. 8.2  Documentation Support
      1. 8.2.1 Related Documentation from Texas Instruments
    3. 8.3  Related Links
    4. 8.4  Community Resources
    5. 8.5  Trademarks
    6. 8.6  Electrostatic Discharge Caution
    7. 8.7  Glossary
    8. 8.8  Device Identification Code Register
    9. 8.9  Die Identification Registers
    10. 8.10 Module Certifications
      1. 8.10.1 FlexRay™ Certifications
      2. 8.10.2 DCAN Certification
      3. 8.10.3 LIN Certification
        1. 8.10.3.1 LIN Master Mode
        2. 8.10.3.2 LIN Slave Mode - Fixed Baud Rate
        3. 8.10.3.3 LIN Slave Mode - Adaptive Baud Rate
  9. 9Mechanical Packaging and Orderable Information
    1. 9.1 Packaging Information

Package Options

Refer to the PDF data sheet for device specific package drawings

Mechanical Data (Package|Pins)
  • PGE|144
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8 Device and Documentation Support

8.1 Device Support

8.1.1 Development Support

Texas Instruments (TI) offers an extensive line of development tools for the TMS570LSxRM48Lx family of MCUs, including tools to evaluate the performance of the processors, generate code, develop algorithm implementations, and fully integrate and debug software and hardware modules.

The following products support development:

Software Development Tools

  • Code Composer Studio™ (CCS) Integrated Development Environment (IDE)–
    • C/C++ Compiler
    • Code generation tools
    • Assembler/Linker
    • FPU Optimized Libraries
  • Application algorithms
  • Sample applications code

Hardware Development Tools

  • Development and evaluation boards
  • JTAG-based emulators - XDS510™ class, XDS560™ emulator, XDS100v2, XDS110, XDS200
  • Flash programming tools

For a complete listing of development-support tools, visit the Texas Instruments website at www.ti.com.

8.1.2 Device Nomenclature

To designate the stages in the product development cycle, TI assigns prefixes to the part numbers of all devices. Each commercial family member has one of three prefixes: TMX, TMP, or TMS (for example, TMS570LS3137). These prefixes represent evolutionary stages of product development from engineering prototypes (TMX) through fully qualified production devices (TMS).

Device development evolutionary flow:

    TMX Experimental device that is not necessarily representative of the final device's electrical specifications.
    TMP Final silicon die that conforms to the device's electrical specifications but has not completed quality and reliability verification.
    TMS Fully-qualified production device.

TMX and TMP devices are shipped against the following disclaimer:

"Developmental product is intended for internal evaluation purposes."

TMS devices have been characterized fully, and the quality and reliability of the device have been demonstrated fully. TI's standard warranty applies.

Predictions show that prototype devices (TMX or TMP) have a greater failure rate than the standard production devices. Texas Instruments recommends that these devices not be used in any production system because their expected end-use failure rate still is undefined. Only qualified production devices are to be used.

Figure 8-1 shows the numbering and symbol nomenclature for the TMS570LS31x5/21x5 .

For additional information on the device nomenclature markings, see the device-specific silicon errata document listed in Section 8.2.1, Related Documentation from Texas Instruments.

TMS570LS3135 TMS570LS2135 TMS570LS2125 device_numbering_conv_f3_pns160.gifFigure 8-1 TMS570LS31x5/21x5 Device Numbering Conventions

8.2 Documentation Support

The following documents describe the TMS570LS31x5/21x5 microcontroller..

    SPNU499TMS570LS31x/21x 16/32-Bit RISC Flash Microcontroller Technical Reference Manual details the integration, the environment, the functional description, and the programming models for each peripheral and subsystem in the device.
    SPNZ195TMS570LS31x/21x Microcontroller, Silicon Revision C, Silicon Errata describes the usage notes and known exceptions to the functional specifications for the device silicon revision C.
    SPNZ222TMS570LS31x/21x Microcontroller, Silicon Revision D, Silicon Errata describes the usage notes and known exceptions to the functional specifications for the device silicon revision D.
    SPNA207Calculating Equivalent Power-on-Hours for Hercules™ Safety MCUs details how to use the spreadsheet to calculate the aging effect of temperature on Texas Instruments Hercules Safety MCUs.

8.3 Related Links

The table below lists quick access links. Categories include technical documents, support and community resources, tools and software, and quick access to sample or buy.

PARTS PRODUCT FOLDER SAMPLE & BUY TECHNICAL DOCUMENTS TOOLS & SOFTWARE SUPPORT & COMMUNITY
TMS570LS2125 Click here Click here Click here Click here Click here
TMS570LS2135 Click here Click here Click here Click here Click here
TMS570LS3135 Click here Click here Click here Click here Click here

8.4 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

    TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
    TI Embedded Processors Wiki Texas Instruments Embedded Processors Wiki. Established to help developers get started with Embedded Processors from Texas Instruments and to foster innovation and growth of general knowledge about the hardware and software surrounding these devices.

8.5 Trademarks

Code Composer Studio, XDS510, XDS560, E2E are trademarks of Texas Instruments.

ARM, Cortex are registered trademarks of ARM Limited (or its subsidiaries) in the EU and.

CoreSight is a trademark of ARM Limited.

I2C-bus is a trademark of NXP Semiconductors N. V.

All other trademarks are the property of their respective owners.

8.6 Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

8.7 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.

8.8 Device Identification Code Register

The device identification code register identifies several aspects of the device including the silicon version. The details of the device identification code register are shown in Table 8-2. The device identification code register value for this device is:

  • Rev A = 0x802AAD05
  • Rev B = 0x802AAD15
  • Rev C = 0x802AAD1D
  • Rev D = 0x802AAD25

Figure 8-2 Device ID Bit Allocation Register
31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16
CP-15 UNIQUE ID TECH
R-1 R-00000000010101 R-0
15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
TECH I/O VOLTAGE PERIPH PARITY FLASH ECC RAM ECC VERSION 1 0 1
R-101 R-0 R-1 R-10 R-1 R-00000 R-1 R-0 R-1
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 8-2 Device ID Bit Allocation Register Field Descriptions

BIT FIELD VALUE DESCRIPTION
31 CP15 Indicates the presence of coprocessor 15
1 CP15 present
30-17 UNIQUE ID 10101

Silicon version (revision) bits.

This bit field holds a unique number for a dedicated device configuration (die).
16-13 TECH Process technology on which the device is manufactured.
0101 F021
12 I/O VOLTAGE I/O voltage of the device.
0 I/O are 3.3 V
11 PERIPHERAL PARITY Peripheral Parity
1 Parity on peripheral memories
10-9 FLASH ECC Flash ECC
10 Program memory with ECC
8 RAM ECC Indicates if RAM memory ECC is present.
1 ECC implemented
7-3 REVISION Revision of the device.
2-0 101 The platform family ID is always 0b101

8.9 Die Identification Registers

The two die ID registers at addresses 0xFFFFFF7C and 0xFFFFFF80 form a 64-bit die ID with the information as shown in Table 8-3.

Table 8-3 Die-ID Registers

ITEM NUMBER OF BITS BIT LOCATION
X Coord. on Wafer 12 0xFFFFFF7C[11:0]
Y Coord. on Wafer 12 0xFFFFFF7C[23:12]
Wafer # 8 0xFFFFFF7C[31:24]
Lot # 24 0xFFFFFF80[23:0]
Reserved 8 0xFFFFFF80[31:24]

8.10 Module Certifications

The following communications modules have received certification of adherence to a standard.

8.10.1 FlexRay™ Certifications

TMS570LS3135 TMS570LS2135 TMS570LS2125 FlexRay_Certification_TMS570LS3137ZWT_RevC_2013-04-27.gifFigure 8-3 FlexRay Certification for ZWT Package
TMS570LS3135 TMS570LS2135 TMS570LS2125 FlexRay_Certification_TMS570LS3137PGE_RevC_2013-05-05.gifFigure 8-4 FlexRay Certification for PGE Package

8.10.2 DCAN Certification

TMS570LS3135 TMS570LS2135 TMS570LS2125 CAN_Certification_2011_02_08.pngFigure 8-5 DCAN Certification

8.10.3 LIN Certification

8.10.3.1 LIN Master Mode

TMS570LS3135 TMS570LS2135 TMS570LS2125 LIN_Certification_DLL21_Master_20121130_130513_TMS570LS_V1 0.pngFigure 8-6 LIN Certification - Master Mode

8.10.3.2 LIN Slave Mode - Fixed Baud Rate

TMS570LS3135 TMS570LS2135 TMS570LS2125 LIN_Certification_DLL21_Slave_Fixed_20121130_130513_TMS570LS_V1 0.pngFigure 8-7 LIN Certification - Slave Mode - Fixed Baud Rate

8.10.3.3 LIN Slave Mode - Adaptive Baud Rate

TMS570LS3135 TMS570LS2135 TMS570LS2125 new_LIN_Certification_Slave_Adapt.pngFigure 8-8 LIN Certification - Slave Mode - Adaptive Baud Rate