4 Revision History
Changes from E Revision (December 2014) to F Revision
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Added test condition frequency to capacitance Go
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Added test condition frequency to capacitance Go
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Added Community Resources Go
Changes from D Revision (August 2013) to E Revision
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Added Handling Ratings table, Feature Description section, Device Functional Modes section, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section. Go
Changes from * Revision (January 2013) to A Revision
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Added Eye Diagram Using EVM Without TPD12S016 for the TMDS Lines at 1080p, 340MHz Pixel Clock, 3.4GbpsGo
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Added Eye Diagram Using EVM with TPD12S016 for the TMDS Lines at 1080p, 340MHz Pixel Clock, 3.4GbpsGo
Changes from A Revision (February 2013) to B Revision
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Added PW and RKT packages values for IO capacitanceGo
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Added LOAD SWITCH ILEAKAGE_REVERSE vs V5V_OUT graph.Go
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Updated Circuit Schematic Diagram.Go
Changes from B Revision (February 2013) to C Revision
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Updated table formatting.Go
Changes from C Revision (August 2013) to D Revision
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Updated power savings options table.Go