SLVSDH9D March   2016  – August 2020 TPD3S716-Q1

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings—AEC Specification
    3. 6.3 ESD Ratings—IEC Specification
    4. 6.4 ESD Ratings—ISO Specification
    5. 6.5 Recommended Operating Conditions
    6. 6.6 Thermal Information
    7. 6.7 Electrical Characteristics
    8. 6.8 Timing Characteristics
    9. 6.9 Typical Characteristics
  7. 7 Parameter Measurement Information
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  AEC-Q100 Qualified
      2. 8.3.2  Short-to-Battery and Short-to-Ground Protection on VBUS_CON
      3. 8.3.3  Short-to-Battery and Short-to-VBUS Protection on VD+, VD–
      4. 8.3.4  ESD Protection on VBUS_CON, VD+, VD–
      5. 8.3.5  Low RON nFET VBUS Switch
      6. 8.3.6  High Speed Data Switches
      7. 8.3.7  Adjustable Hiccup Current Limit up to 2.4-A
      8. 8.3.8  Fast Over-Voltage Response Time
      9. 8.3.9  Independent VBUS and Data Enable Pins for Configuring both Host and Client/OTG Mode
      10. 8.3.10 Fault Output Signal
      11. 8.3.11 Thermal Shutdown Feature
      12. 8.3.12 16-Pin SSOP Package
      13. 8.3.13 Reverse Current Detection
    4. 8.4 Device Functional Modes
      1. 8.4.1 Normal Operation
      2. 8.4.2 Overvoltage Condition
      3. 8.4.3 Overcurrent Condition
      4. 8.4.4 Short-Circuit Condition
      5. 8.4.5 Device Logic Table
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Short-to-Battery Tolerance
        2. 9.2.2.2 Maximum Current on VBUS
        3. 9.2.2.3 Power Dissipation and Junction Temperature
        4. 9.2.2.4 USB Data Rate
      3. 9.2.3 Application Curves
  10. 10Power Supply Recommendations
    1. 10.1 VBUS Path
    2. 10.2 VIN Pin
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
    3. 11.3 Layout Optimized for Thermal Performance
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Support Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

9.2.2.1 Short-to-Battery Tolerance

The TPD3S716-Q1 is capable of handling up to 18 V DC on the VD+, VD–, and VBUS_CON pins. In the event of a short-to-battery on VBUS_CON, significant ringing would be expected because of the hot plug-like nature of the short-to-battery event. In typical ceramic capacitor configurations, a standard RLC response is expected which results in a ringing of nearly two times the applied DC voltage. The TPD3S716-Q1 is capable of withstanding the transient ringing from hot plug-like events, assuming some precautions are taken.

Careful capacitor selection on the VBUS_CON pin must be observed. A capacitor with a low derating percentage under the applied voltages must be used to prevent excess ringing. In the example, a 1-µF, 100-V tolerant ceramic X7R capacitor is used. It is best practice to carefully select the capacitors used in this circuit to prevent derating-based voltage spikes under hot plug events. See Figure 9-4 and Figure 9-5 to compare ringing of a 50-V capacitor to a 100-V capacitor. Figure 9-6 shows the 100-V capacitor with the TPD3S716-Q1 installed.

Another alternative to a high rated ceramic capacitor is to implement either a standard R-C snubber circuit, or a small external TVS diode. Depending on the short-to-battery tolerance needed, no special precautions may be needed.