6.2 ESD Ratings
|
VALUE |
UNIT |
V(ESD) |
Electrostatic discharge |
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) |
±2500 |
V |
Charged device model (CDM), per JEDEC specification JESD22-C101(2) |
±1000 |
IEC 61000-4-2 Contact Discharge |
±15000 |
IEC 61000-4-2 Air-gap Discharge |
±15000 |
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.5 Electrical Characteristics
TA = –40°C to +125°C (unless otherwise specified)
PARAMETER |
TEST CONDITIONS |
MIN |
TYP |
MAX |
UNIT |
VRWM |
Reverse stand-off voltage |
|
|
|
±5.5 |
V |
ILEAK |
Leakage current |
Pins = 5 V, GND = 0 V |
|
|
100 |
nA |
VClamp1,2 |
Clamp voltage from data pin to ground pin |
IPP = 1 A, 8/20 μs(1) |
|
10 |
|
V |
IPP = 3 A, 8/20 μs(1) |
|
13 |
|
V |
VClamp2,1 |
Clamp voltage from ground pin to data pin |
IPP = 1 A, 8/20 μs(1) |
|
9 |
|
V |
IPP = 3 A, 8/20 μs(1) |
|
13 |
|
V |
RDYN |
Dynamic resistance |
Pins to GND(2) |
|
0.45 |
|
Ω |
GND to Pins(2) |
|
0.42 |
|
Ω |
CIO |
I/O Capacitance |
VIO = 2.5 V |
|
4.8 |
7 |
pF |
VBRF |
Break-down voltage, pin 1, 2, 3, or 4 to GND |
IIO = 1 mA |
6 |
|
|
V |
VBRR |
Break-down voltage, GND to pin 1, 2, 3, or 4 |
IIO = 1 mA |
6 |
|
|
V |
(1) Non-repetitive current pulse 8/20 µs exponentially decaying waveform according to IEC61000-4-5.
(2) Extraction of RDYN using least squares fit of TLP characteristics between I = 10 A and I = 20 A.