SLVSBQ8E December 2012 – October 2024 TPD4E1B06
PRODUCTION DATA
PARAMETER | TEST CONDITION | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VRWM | Reverse stand-off voltage | –5.5 | 5.5 | V | ||
VCLAMP | Clamp voltage with ESD strike, IO to GND | IPP = 1 A, tp = 8/20 μSec, from I/O to GND or GND to I/O | 10.9 | V | ||
IPP = 3 A, tp = 8/20 μSec, from I/O to GND or GND to I/O | 14.5 | V | ||||
RDYN | Dynamic resistance | ITLP = 10 A to 20 A, I/O to GND | 1 | Ω | ||
ITLP = 10 A to 20 A, GND to I/O | 0.8 | |||||
CL | Line capacitance | f = 1 MHz, VBIAS = 2.5 V | 0.7 | 0.95 | pF | |
VBR | Break-down voltage | IIO = 1 mA, from I/O to GND or GND to I/O | 7 | 9.5 | V | |
ILEAK | Leakage current | VIO = 2.5 V | 0.5 | nA |