over operating free-air temperature range (unless otherwise noted)(1) | MIN | MAX | UNIT |
---|
VSUP (2) | Supply line supply voltage(3) | 0 | 40 | V |
VNWake | NWake dc and transient input voltage (through 33-kΩ serial resistor) | –0.3 | 40 | V |
VINH | INH voltage | –0.3 | VSUP + 0.3 | V |
| Logic pin input voltage (RXD, TXD, EN) | –0.3 | 5.5 | V |
VLIN | LIN dc-input voltage | –40 | 40 | V |
INWake | NWake current(4) | | –3.6 | mA |
| Thermal shutdown | | 200 | °C |
| Thermal shutdown hysteresis | | 25 | °C |
TJ | Junction temperature | –40 | 150 | °C |
Tstg | Storage temperature | –40 | 165 | °C |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to GND.
(3) The device is specified for operation in the range of VSUP from 7 V to 27 V. Operating the device above 27 V may significantly raise the junction temperature of the device and system level thermal design requires consideration.
(4) If due to ground shifts, VNWake ≤ VGND – 0.3 V, thus the current into NWake must be limited through a serial resistance.