SLIS134C March 2011 – September 2015
PRODUCTION DATA.
MIN | MAX | UNIT | |||
---|---|---|---|---|---|
VDD to GND | Supply voltage | –0.3 | 7 | V | |
VSS to GND | –7 | 0.3 | V | ||
VDD to VSS | 7 | V | |||
VH, VL, VW | Voltage at resistor terminals | VSS – 0.3 | VDD + 0.3 | V | |
VI | Digital input voltage | –0.3 | VDD + 0.3 | V | |
IH, IL, IW
|
Pulse current | ±20 | mA | ||
Continuous current | ±2 | mA | |||
Tstg | Storage temperature | -65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±2000 | V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±1000 |
THERMAL METRIC (1) | TPL0102 | UNIT | ||
---|---|---|---|---|
PW (TSSOP) | RUC (X2QFN) | |||
14 PINS | 14 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 112.9 | 119.4 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 39.9 | 51.3 | °C/W |
RθJB | Junction-to-board thermal resistance | 55.9 | 59.0 | °C/W |
ψJT | Junction-to-top characterization parameter | 3.5 | 1.2 | °C/W |
ψJB | Junction-to-board characterization parameter | 55.2 | 59.0 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |||
---|---|---|---|---|---|---|---|---|
RTOT | End-to-End resistance (Between H and L Terminals) |
80 | 100 | 120 | kΩ | |||
RH, RL | Terminal resistance | 60 | 200 | Ω | ||||
RW | Wiper resistance | 25 | 100 | Ω | ||||
CH, CL (14) (15) | Terminal capacitance | 22 | pF | |||||
CW (14) (15) | Wiper capacitance | 16 | pF | |||||
ILKG | Terminal leakage current | VH = VSS to VDD, VL = Floating OR VL = VSS to VDD, VH = Floating |
0.1 | 1 | µA | |||
TCR | Resistance temperature coefficient | Input Code = 0x80h | 92 | ppm/°C | ||||
RTOT,MATCH | Channel-to-channel resistance match | 0.1 | % | |||||
Voltage Divider Mode | ||||||||
INL(1)(3) | Integral non-linearity | –0.5 | 0.5 | LSB | ||||
DNL(1)(4) | Differential non-linearity | –0.25 | 0.25 | LSB | ||||
ZSERROR(2)(5) | Zero-scale error | 0 | 0.1 | 2 | LSB | |||
FSERROR(2)(6) | Full-scale error | –2 | –0.1 | 0 | LSB | |||
MATCHVDM(2)(7) | Channel-to-Channel matching | Wiper at the same tap position, same voltage at all H and same voltage at all L terminals | –2 | 2 | LSB | |||
TCVDM | Ratiometric temperature coefficient | Wiper set at mid-scale | 4 | ppm/°C | ||||
BW | Bandwidth | Wiper set at mid-scale CLOAD = 10 pF |
229 | kHz | ||||
tSW | Wiper setting time | 3.6 | µs | |||||
THD | Total harmonic distortion | VH = 1 VRMS at 1 kHz, VL = (VDD – VSS)/2, Measurement at pin W |
0.03 | % | ||||
XTALK | Cross talk | fH = 1 kHz, VL = GND, Measurement at pin W |
–82 | dB | ||||
RHEOSTAT MODE (Measurements between W and L with H not connected, or between W and H with L not connected) | ||||||||
RINL(8)(10) | Integral non-linearity | –1 | 1 | LSB | ||||
RDNL(8)(11) | Differential non-linearity | –0.5 | 0.5 | LSB | ||||
OFFSETRM(9)(12) | Offset | 0 | 0.2 | 2 | LSB | |||
MATCHRM(9)(13) | Channel-to-Channel matching | –2 | 2 | LSB | ||||
BW | Bandwidth | Code = 0x00h, L Floating, Input applied to W, Measure at H, CLOAD = 10 pF |
54 | kHz |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
IDD(STBY) | VDD standby current | VDD = 2.75 V, VSS = –2.75, I2C interface in standby mode |
0.2 | 1 | µA | |
ISS(STBY) | VSS standby current | VDD = 2.75 V, VSS = –2.75, I2C interface in standby mode |
–1 | –0.2 | µA | |
IDD(SHUTDOWN) | VDD shutdown current | VDD = 2.75 V, VSS = –2.75, I2C interface in standby mode |
0.2 | 1 | µA | |
ISS(SHUTDOWN) | VSS shutdown current | VDD = 2.75 V, VSS = –2.75, I2C interface in standby mode |
–1 | –0.2 | µA | |
IDD | VDD current during non-volatile write | VDD = 2.75 V, VSS = –2.75 | 200 | µA | ||
ISS | VSS current during non-volatile write | VDD = 2.75 V, VSS = –2.75 | –200 | µA | ||
ILKG(DIG) | Digital pins leakage current (A0, A1, A2, SDA, and SCL) |
–1 | 1 | µA | ||
VPOR | Power-on recall voltage | Minimum VDD at which memory recall occurs | 23 | V | ||
EEPROM Specification | ||||||
EEPROM endurance | 100 000 | Cycles | ||||
EEPROM retention | TA = 85°C | 100 | Years | |||
tWC | Non-volatile write cycle time | 20 | ms | |||
Wiper Timing Characteristics | ||||||
t(WRT) | Wiper response time | SCL falling edge of last bit of wiper data byte to wiper new position | 600 | ns | ||
t(SR) | Wiper position recall time from shut-down mode | SCL falling edge of last bit of ACR data byte to wiper stored position and H connection | 800 | ns | ||
t(D) | Power-up delay | VDD above VPOR, to wiper initial value register recall completed, and I2C interface in standby mode | 35 | 100 | µs | |
C(PIN) | Pin capacitance | A0, A1, A2, SDA, SCL pins | 7 | pF | ||
I2C Interface Specifications | ||||||
VIH | Input high voltage | 0.7 x VDD | 5.5 | V | ||
VIL | Input low voltage | 0 | 0.3 x VDD | V | ||
VOL | Output low voltage | SDA pin, IOL = 4 mA | 0.4 | V | ||
CIN | Pin capacitance | A0, A1, A2, SDA, SCL pins | 7 | pF |
STANDARD MODE I2C BUS |
FAST MODE I2C BUS |
UNIT | ||||
---|---|---|---|---|---|---|
MIN | MAX | MIN | MAX | |||
I2C Interface Timing Requirements | ||||||
fSCL | I2C clock frequency | 0 | 100 | 0 | 400 | kHz |
tSCH | I2C clock high time | 4 | 0.6 | µs | ||
tSCL | I2C clock low time | 4.7 | 1.3 | µs | ||
tsp | I2C spike time | 0 | 50 | 0 | 50 | ns |
tSDS | I2C serial data setup time | 250 | 100 | ns | ||
tSDH | I2C serial data hold time | 0 | 0 | ns | ||
tICR | I2C input rise time | 1000 | 20 + 0.1Cb(1) | 300 | ns | |
tICF | I2C input fall time | 300 | 20 + 0.1Cb(1) | 300 | ns | |
tICF | I2C output fall time, 10 pF to 400 pF bus | 300 | 20 + 0.1Cb(1) | 300 | ns | |
tBUF | I2C bus free time between stop and start | 4.7 | 1.3 | µs | ||
tSTS | I2C start or repeater start condition setup time | 4.7 | 1.3 | µs | ||
tSTH | I2C start or repeater start condition hold time | 4 | 0.6 | µs | ||
tSPS | I2C stop condition setup time | 4 | 0.6 | µs | ||
tVD(DATA) | Valid data time, SCL low to SDA output valid | 1 | 1 | µs | ||
3tVD(ACK) | Valid data time of ACK condition, ACK signal from SCL low to SDA (out) low | 1 | 1 | µs |