SNAS651A January   2015  – September 2018 TPL5010

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Device Images
      1.      Simplified Application Schematic
  4. 4 Revision History
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Ratings
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 WAKE
      2. 8.3.2 DONE
      3. 8.3.3 RSTn
    4. 8.4 Device Functional Modes
      1. 8.4.1 Start-Up
      2. 8.4.2 Normal Operating Mode
    5. 8.5 Programming
      1. 8.5.1 Configuring the WAKE Interval With the DELAY/M_RST Pin
      2. 8.5.2 Manual Reset
        1. 8.5.2.1 DELAY/M_RST
        2. 8.5.2.2 Circuitry
      3. 8.5.3 Timer Interval Selection Using External Resistance
      4. 8.5.4 Quantization Error
      5. 8.5.5 Error Due to Real External Resistance
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Receiving Notification of Documentation Updates
    2. 12.2 Community Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.6 Timing Requirements

MIN(3) NOM(4) MAX(3) UNIT
trRSTn Rise Time RSTn (2) Capacitive load 50 pF, Rpullup 100 kΩ 11 µs
tfRSTn Fall Time RSTn (2) Capacitive load 50 pF, Rpullup 100 kΩ 50 ns
trWAKE Rise Time WAKE (2) Capacitive load 50 pF 50 ns
tfWAKE Fall Time WAKE (2) Capacitive load 50 pF 50 ns
tDDONE DONE to RSTn or WAKE to DONE delay Minimum delay(1) 100 ns
Maximum delay (1) tIP-20ms ms
tM_RST Valid Manual Reset Observation time 30 ms 20 ms
tDB De-bounce Manual Reset 20 ms
(1) In case of RSTn from its falling edge, or in case of WAKE from its rising edge.
(2) This parameter is specified by design and/or characterization and is not tested in production.
(3) Limits are specified by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are specified through correlations using statistical quality control (SQC) method.
(4) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped production material.
TPL5010 TIMING_5010_rev4.gifFigure 1. TPL5010 Timing