SLUSF08A March 2024 – September 2024 TPS1213-Q1
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
PIN | TYPE(1) | DESCRIPTION | |
---|---|---|---|
NAME | NO. | ||
EN/UVLO | 1 | I | EN/UVLO input. A voltage on this pin above V(ENR) enables normal operation. If EN/UVLO is below V(ENF) then gate drives are turned OFF and FLT asserts low. Forcing this pin below V(ENF) (0.3V) shuts down the device reducing quiescent current. Optionally connect to the input supply through a resistive divider to set the undervoltage lockout. When EN/UVLO is left floating an internal pulldown of 100nA pulls EN/UVLO low and keeps the device in OFF state. |
LPM | 2 | I | Low power mode input. When driven high, the devices enter into active mode. When driven low, the devices enter into low power mode. LPM has an internal weak pull down of 100nA to GND to keep G2 high when LPM is left floating. |
INP | 3 | I | Input signal for external FET control. CMOS compatible input reference to GND that sets the state of G1PD and G1PU pins. INP has an internal weak pull down of 100nA to GND to keep G1PD pulled to SRC when INP is left floating. |
WAKE | 4 | O | Open drain wake output. This pin asserts low when the device enters into active mode (when LPM is driven high or when a load wake up event has occurred). |
FLT | 5 | O | Open drain fault output. This pin asserts low during short circuit fault, charge pump UVLO, input UVLO and during SCP comparator diagnosis. If FLT feature is not desired then connect it to GND. |
GND | 6 | G | Connect GND to system ground. |
CS_SEL | 7 | — | Reserved for future use. Connect to GND. |
ISCP/LWU | 8 | I | Short circuit detection and load wakeup threshold setting. SCP control for G1 during active mode (LPM = high) and load wakeup control on G2 during low power mode (LPM = low). |
TMR | 9 | I | Fault timer input. A capacitor across TMR pin to GND sets the times for fault turnoff. Leave it open for fastest setting (< 10µs). Connect ISCP/LWU and TMR pin to GND to disable overcurrent protection. |
SCP_TEST | 10 | I | Internal short circuit comparator (SCP) diagnosis input. When SCP_TEST is driven low to high with INP pulled high, the internal SCP comparator operation is checked. FLT goes low and G1PD gets pulled to SRC if SCP comparator is functional.Connect SCP_TEST pin to GND if this feature is not desired. SCP_TEST has an internal weak pull down of 100nA to GND. |
G2 | 11 | O | Low power mode FET gate drive output. It has 165 µA pullup and 2 A sink capacity |
BST | 12 | O | High side bootstrapped supply. An external capacitor with a minimum value of > Qg(tot) of the external FET must be connected between this pin and SRC. |
SRC | 13 | O | Source connection of the external FET. |
G1PD | 14 | O | High current gate driver pulldown. This pin pulls down to SRC. For the fastest turnoff, tie this pin directly to the gate of the external high side MOSFET. |
G1PU | 15 | O | High current gate driver pullup. This pin pulls up to BST. Connect this pin to G1PD for maximum gate drive transition speed. A resistor can be connected between this pin and the gate of the external MOSFET to control the in-rush current during turnon. |
CS– | 17 | I | Current sense negative input. |
CS+ | 18 | I | Current sense positive input. |
N.C | 19 | — | No connect. |
VS | 20 | P | Supply pin of the controller. |