SLUSFA1 September   2024 TPS1214-Q1

ADVANCE INFORMATION  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Device Comparison
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Switching Characteristics
  8. Parameter Measurement Information
  9. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Charge Pump and Gate Driver Output (VS, GATE, BST, SRC)
      2. 8.3.2 Capacitive Load Driving
        1. 8.3.2.1 Using Low Power Bypass FET (G Drive) for Load Capacitor Charging
        2. 8.3.2.2 Using Main FET (GATE drive) Gate Slew Rate Control
      3. 8.3.3 Overcurrent and Short-Circuit Protection
        1. 8.3.3.1 I2t-Based Overcurrent Protection
          1. 8.3.3.1.1 I2t-Based Overcurrent Protection With Auto-Retry
          2. 8.3.3.1.2 I2t-Based Overcurrent Protection With Latch-Off
        2. 8.3.3.2 Short-Circuit Protection
      4. 8.3.4 Analog Current Monitor Output (IMON)
      5. 8.3.5 NTC based Temperature Sensing (TMP) and Analog Monitor Output (ITMPO)
      6. 8.3.6 Fault Indication and Diagnosis (FLT, SCP_TEST)
      7. 8.3.7 Reverse Polarity Protection
      8. 8.3.8 Undervoltage Protection (UVLO)
    4. 8.4 Device Functional Modes
      1. 8.4.1 State Diagram
      2. 8.4.2 State Transition Timing Diagram
      3. 8.4.3 Power Down
      4. 8.4.4 Shutdown Mode
      5. 8.4.5 Low Power Mode (LPM)
      6. 8.4.6 Active Mode (AM)
  10. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application 1: Driving Power at all times (PAAT) Loads With Automatic Load Wakeup
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curves
    3. 9.3 Typical Application 2: Driving Power at all times (PAAT) Loads With Automatic Load Wakeup and Output Bulk Capacitor Charging
      1. 9.3.1 Design Requirements
      2. 9.3.2 External Component Selection
      3. 9.3.3 Application Curves
    4. 9.4 Power Supply Recommendations
    5. 9.5 Layout
      1. 9.5.1 Layout Guidelines
      2. 9.5.2 Layout Example
  11. 10Device and Documentation Support
    1. 10.1 Device Support
    2. 10.2 Documentation Support
      1. 10.2.1 Related Documentation
    3. 10.3 Receiving Notification of Documentation Updates
    4. 10.4 Support Resources
    5. 10.5 Trademarks
    6. 10.6 Electrostatic Discharge Caution
    7. 10.7 Glossary
  12. 11Revision History
  13. 12Mechanical, Packaging, and Orderable Information
    1. 12.1 Tape and Reel Information
    2. 12.2 Mechanical Data

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Fault Indication and Diagnosis (FLT, SCP_TEST)

The TPS1214-Q1 features integrated charge pump UVLO feature. The voltage across BST-SRC is internally monitored. If the voltage is < V(BST_UVLO) then FLT is asserted low. Both the GATE and G gate drives also get disabled in this condition turning OFF main and bypass FETs. FLT gets de-asserted and gate drivers get enabled when BST to SRC voltage rises above V(BST_UVLO).

FLT asserts low in TPS1214-Q1 when short-circuit or I2t based overcurrent or charge pump UVLO is detected.

In the safety critical designs, short-circuit protection (SCP) feature and its diagnosis (SCP_TEST) is important.

The TPS1214-Q1 also features the diagnosis of the internal short circuit protection. SCP_TEST diagnosis can be done in low power mode or active mode.

  • Short-circuit protection diagnosis in active mode:

When SCP_TEST is driven low to high in active mode then, a voltage is applied internally across the SCP comparator inputs to simulate a short circuit event. The comparator output controls the gate drive (GATE) and also the FLT. If the gate drive goes low (with initially being high due to INP = High) and FLT also goes low then it indicates that the SCP is good otherwise it is to be treated as SCP feature is not functional.

  • Short-circuit protection diagnosis in low power mode:

When SCP_TEST is driven low to high in low power mode then, internal short-circuit protection (SCP) comparator wakeup up in low power mode and a voltage is applied internally across the SCP comparator inputs to simulate a short circuit event. The comparator output controls the FLT. If the FLT also goes low then it indicates that the SCP is good otherwise it is to be treated as SCP feature is not functional. G drive reamins ON while SCP_TEST is pulled high. This ensures output always connected to input during diagnosis in low power mode.