7.1 Absolute Maximum Ratings
Over operating free-air temperature range (unless otherwise noted)(1)
|
MIN |
MAX |
UNIT(2) |
VIN |
Supply voltage |
–0.3 |
4 |
V |
VOUT |
Output voltage |
–0.3 |
(VIN + 0.3) |
V |
VON |
Input voltage |
–0.3 |
4 |
V |
IMAX |
Maximum Continuous Switch Current for VIN ≥ 1.2 V |
|
1 |
A |
Maximum Continuous Switch Current at VIN = 1 V |
|
0.6 |
TJ |
Maximum junction temperature(3) |
|
125 |
°C |
TLEAD |
Maximum lead temperature (10-s soldering time) |
|
300 |
°C |
TSTG |
Storage temperature |
–65 |
150 |
°C |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to network ground terminal.
(3) In applications where high power dissipation and/or poor package thermal resistance is present, the maximum ambient temperature may have to be derated. Maximum ambient temperature [TA(max)] is dependent on the maximum operating junction temperature [TJ(max)], the maximum power dissipation of the device in the application [PD(max)], and the junction-to-ambient thermal resistance of the part/package in the application (RθJA), as given by the following equation: TA(max) = TJ(max) – (RθJA × PD(max))
7.2 ESD Ratings
|
VALUE |
UNIT |
V(ESD) |
Electrostatic discharge |
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) |
±2000 |
V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) |
±1000 |
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.