SLVSC97B March 2014 – September 2020 TPS2556-Q1 , TPS2557-Q1
PRODUCTION DATA
Assertion (active-low) of the FAULT open-drain output occurs during an overcurrent or overtemperature condition. The TPS2556-Q1 and TPS2557-Q1 devices assert the FAULT signal until removal of the fault condition and the resumption of normal device operation. Design of the TPS2556-Q1 and TPS2557-Q1 devices eliminates false FAULT reporting by using an internal delay (9-ms typical) deglitch circuit for overcurrent conditions without the need for external circuitry. This avoids accidental FAULT assertion due to normal operation, such as starting into a heavy capacitive load. The deglitch circuitry delays entering and leaving current-limit-induced fault conditions. Deglitching of the FAULT signal does not occur when an overtemperature condition disables the MOSFET, but does occur after the device has cooled and begins to turn on. This unidirectional deglitch prevents FAULT oscillation during an overtemperature event.