SLVSGX1A July 2023 – October 2023 TPS25984
PRODUCTION DATA
Table 8-3 summarizes the device response to various fault conditions.
Event or Condition | Device Response | Fault Latched Internally | FLT Pin Status | Delay |
---|---|---|---|---|
Steady-state | None | N/A | H | |
Inrush | None | N/A | H | |
Overtemperature | Shutdown | Y | L | |
Undervoltage (EN/UVLO) | Shutdown | N | H | |
Undervoltage (VDD UVP) | Shutdown | N | H | |
Undervoltage (VIN UVP) | Shutdown | N | H | |
Overvoltage (VIN OVP) | Shutdown | N | H | |
Transient overcurrent | None | N | H | |
Persistent overcurrent (steady-state) | Circuit-Breaker | Y | L | tITIMER |
Persistent overcurrent (start-up) | Current Limit | N | L | |
Short-circuit (primary mode) | Fast-trip | Y | L | tFT |
Short-circuit (secondary mode) | Fast-trip followed by current limited Start-up | N | H | |
ILIM pin open (start-up) | Shutdown | Y | L | |
ILIM pin short (start-up) | Shutdown (if IOUT > IOC_BKP) | Y | L | |
ILIM pin open (steady-state) | Active current sharing loop always active | N | H | |
ILIM pin short (steady-state) | Active current sharing loop disabled | N | H | |
IMON pin open (steady-state) | Shutdown | Y | L | |
IMON pin short (steady-state) | Shutdown (If IOUT > IOC_BKP) | Y | L | 45 μs |
IREF pin open (start-up) | Shutdown (If IOUT > IOC_BKP) | Y | L | |
IREF pin open (steady-state) | Shutdown (if IOUT > IOC_BKP) | Y | L | tITIMER |
IREF pin short (steady-state) | Shutdown | Y | L | |
IREF pin short (start-up) | Shutdown | Y | L | |
ITIMER pin forced to high voltage | Shutdown (if IOUT > IOCP or IOUT > IOC_BKP) | Y | L | tSPFAIL_TMR |
Start-up timeout | Shutdown | Y | L | tSU_TMR |
FET health fault (G-S) | Shutdown | Y | L | 10 us |
FET health fault (G-D) | Shutdown | Y | L | |
FET health fault (D-S) | Shutdown | N | L | tSU_TMR |
External fault (SWEN pulled low externally while device is not in UV or OV) | Shutdown | Y | L |
FLT is an open-drain pin and must be pulled up to an external supply.
The device response after a fault varies based on the mode of operation:
For faults that are latched internally, power cycling the part or pulling the EN/UVLO pin voltage below VSD(F) clears the fault and the pin is de-asserted. This action also clears the tRST timer (auto-retry variants only). Pulling the EN/UVLO just below the UVLO threshold has no impact on the device in this condition. This is true for both latch-off and auto-retry variants.