SLVSFE3C November   2020  – December 2021 TPS2661

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Overload Protection and Fast-Trip
      2. 8.3.2 Reverse Current Blocking for Unipolar Current Inputs TPS26610, TPS26611 and TPS26612 (4–20 mA, 0–20 mA)
      3. 8.3.3 OUTPUT and INPUT Cutoff During Overvoltage, Undervoltage Due to Miswiring
        1. 8.3.3.1 Output Overvoltage With TPS2661x Devices
        2. 8.3.3.2 Output or Input Undervoltage With TPS26610, TPS26611 and TPS26612
        3. 8.3.3.3 Output Undervoltage With TPS26613 and TPS26614
      4. 8.3.4 External Power Supply (±Vs)
      5. 8.3.5 Loop Testing Without ±Vs Supply (Loop Power Mode in TPS26610, TPS26613 Only)
        1. 8.3.5.1 Supply Sensing With VSNS for Loop Power Mode With TPS26610 and TPS26613
      6. 8.3.6 Enable Control With TPS26611, TPS26612, and TPS26614
      7. 8.3.7 Signal Good Indicator (SGOOD)
    4. 8.4 Device Functional Modes
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application: Analog Input Protection for Current Inputs with TPS26610
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure for Current Inputs with TPS26610
        1. 9.2.2.1 Selecting ±Vs Supplies for TPS26610
        2. 9.2.2.2 Selecting RBurden
        3. 9.2.2.3 Selecting MODE Configuration for TPS26610
      3. 9.2.3 Application Performance Plots for Current Inputs with TPS26610
    3. 9.3 Typical Application: Analog Input Protection for Multiplexed Current and Voltage Inputs with TPS26611
      1. 9.3.1 Design Requirements
      2. 9.3.2 Detailed Design Procedure for Analog Input Protection for Multiplexed Current and Voltage Inputs with TPS26611
        1. 9.3.2.1 Selecting ±Vs Supplies for TPS26611
        2. 9.3.2.2 Selecting MODE Configuration for TPS26611
        3. 9.3.2.3 Selecting Bias Resistors R1, R2 for Setting Common Mode Voltage for Voltage Inputs
      3. 9.3.3 Application Performance Plots for V/I Inputs with TPS26611
    4. 9.4 System Examples
      1. 9.4.1 Power Supply Protection of 2-Wire Transmitter with TPS26612
      2. 9.4.2 Protection of 3-Wire Transmitters and Analog Output Modules With TPS26611, TPS26612
      3. 9.4.3 UART IO Protection With TPS26611, TPS26612
      4. 9.4.4 Higher Loop Impedance With TPS26613 and TPS26614
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Receiving Notification of Documentation Updates
    2. 12.2 Support Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

7.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
IN, OUT, IN-OUT –55 55 V
SGOOD, EN,MODE, VSNS –0.3 5.5 V
+Vs -0.3 32 V
-Vs –22 0.3 V
IMODE, ISGOOD, IEN Source Current Internally Limited
IEN Sink Current Internally Limited
ISGOOD 200 µA
TJ Operating Junction temperature –40 150 °C
Transient Junction temperature –65 T(TSD)
Tstg Storage temperature –65 150
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.