SNVSCG1
july 2023
TPS38700S-Q1
PRODUCTION DATA
1
1
Features
2
Applications
3
Description
4
Revision History
5
Device Comparison
6
Pin Configuration and Functions
7
Specifications
7.1
Absolute Maximum Ratings
7.2
ESD Ratings
7.3
Recommended Operating Conditions
7.4
Thermal Information
7.5
Electrical Characteristics
7.6
Timing Requirements
7.7
Typical Characteristics
8
Detailed Description
8.1
Overview
8.2
Functional Block Diagram
8.3
Feature Description
8.3.1
Device State Diagram
8.3.2
Sync Functionality
8.3.3
Transitioning Sequences
8.3.3.1
Power Up
8.3.3.2
Power Down
8.3.3.3
Emergency Power Down
8.3.4
BACKUP State
8.3.5
Thermal Shutdown (TSD) State
8.3.6
I2C
8.3.6.1
I2C
8.4
Register Map Table
8.4.1
Register Descriptions
9
Application and Implementation
9.1
Application Information
9.2
Typical Application
9.2.1
Automotive Multichannel Sequencer and Monitor
9.2.2
Design Requirements
9.2.3
Detailed Design Procedure
9.2.4
Test Implementation
9.2.5
Application Curves
10
Power Supply Recommendations
10.1
Power Supply Guidelines
11
Layout
11.1
Layout Guidelines
11.2
Layout Example
12
Device and Documentation Support
12.1
Device Nomenclature
12.2
Receiving Notification of Documentation Updates
12.3
Support Resources
12.4
Trademarks
12.5
Electrostatic Discharge Caution
12.6
Glossary
Mechanical, Packaging, and Orderable Information
Package Options
Mechanical Data (Package|Pins)
RGE|24
MPQF124G
Thermal pad, mechanical data (Package|Pins)
RGE|24
QFND723
Orderable Information
snvscg1_oa
snvscg1_pm
1
Features
AEC-Q100 qualified with the following results:
Device temperature grade 1: –40°C to +125°C
Sequencing for state-of-the-art SoCs
Capable of sequencing up to 6 power rails
Power up/down timing sequence programmable via I2C
125 us to 64 ms (in 125 us steps)
500 us to 25 ms (in 500 us steps)
System Robustness
Active-low open-drain NIRQ to latch system into safe state during operation error
Connect with a multichannel supervisor like the
TPS389006
-Q1
with Sync pin for full voltage monitoring & sequencing situations
Battery back-up function for diagnostic error reporting during power out events
Device thermal shutdown in high temperature environments