SLVSC33A August   2013  – October 2022 TPS54625

PRODUCTION DATA  

  1. FEATURES
  2. APPLICATIONS
  3. DESCRIPTION
  4. ORDERING INFORMATION (1)
  5. ABSOLUTE MAXIMUM RATINGS
  6. THERMAL INFORMATION
  7. RECOMMENDED OPERATING CONDITIONS
  8. ELECTRICAL CHARACTERISTICS
  9. DEVICE INFORMATION
  10. 10OVERVIEW
  11. 11DETAILED DESCRIPTION
    1. 11.1 PWM Operation
    2. 11.2 PWM Frequency and Adaptive On-Time Control
    3. 11.3 Soft Start and Pre-Biased Soft Start
    4. 11.4 Power Good
    5. 11.5 Output Discharge Control
    6. 11.6 Current Protection
    7. 11.7 Over/Under Voltage Protection
    8. 11.8 UVLO Protection
    9. 11.9 Thermal Shutdown
  12. 12TYPICAL CHARACTERISTICS
  13. 13DESIGN GUIDE
    1. 13.1 Step By Step Design Procedure
    2. 13.2 Output Voltage Resistors Selection
    3. 13.3 Output Filter Selection
    4. 13.4 Input Capacitor Selection
    5. 13.5 Bootstrap Capacitor Selection
    6. 13.6 VREG5 Capacitor Selection
  14. 14THERMAL INFORMATION
  15. 15LAYOUT CONSIDERATIONS
  16. 16Revision History

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range (unless otherwise noted) (1)
VALUE UNIT
VI Input voltage range VIN1, VIN2 EN –0.3 to 20 V
VBST –0.3 to 26 V
VBST (10 ns transient) –0.3 to 28 V
VBST (vs SW1, SW2) –0.3 to 6.5 V
VFB, VO, SS, PG –0.3 to 6.5 V
SW1, SW2 –2 to 20 V
SW1, SW2 (10 ns transient) –3 to 22 V
VO Output voltage range VREG5 –0.3 to 6.5 V
PGND1, PGND2 –0.3 to 0.3 V
Vdiff Voltage from GND to POWERPAD –0.2 to 0.2 V
ESD rating Electrostatic discharge Human Body Model (HBM) 2 kV
Charged Device Model (CDM) 500 V
TJ Operating junction temperature –40 to 150 °C
Tstg Storage temperature –55 to 150 °C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.