SLVSGT5 December 2023 TPS55289-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
I2C TIMING | ||||||
fSCL | SCL clock frequency | 100 | 1000 | kHz | ||
tBUF | Bus free time between a STOP and START condition | Fast mode plus | 0.5 | µs | ||
tHD(STA) | Hold time (repeated) START condition | 260 | ns | |||
tLOW | Low period of the SCL clock | 0.5 | µs | |||
tHIGH | High period of the SCL clock | 260 | ns | |||
tSU(STA) | Setup time for a repeated START condition | 260 | ns | |||
tSU(DAT) | Data setup time | 50 | ns | |||
tHD(DAT) | Data hold time | 0 | µs | |||
tRCL | Rise time of SCL signal | 120 | ns | |||
tRCL1 | Rise time of SCL signal after a repeated START condition and after an ACK bit | 120 | ns | |||
tFCL | Fall time of SCL signal | 120 | ns | |||
tRDA | Rise time of SDA signal | 120 | ns | |||
tFDA | Fall time of SDA signal | 120 | ns | |||
tSU(STO) | Setup time of STOP condition | 260 | ns | |||
CB | Capacitive load for SDA and SCL | 200 | pF |