SLUSDN9B November 2021 – July 2022 TPS62441-Q1 , TPS62442-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
SUPPLY | ||||||
IQ | Quiescent current | EN1 or EN2 = VIN, no load, device is not switching, TJ = 25°C, MODE = GND, one converter enabled | 27 | µA | ||
IQ | Quiescent current | EN1 or EN2 = VIN, no load, device is not switching, MODE = GND, one converter enabled | 22 | 66 | µA | |
IQ | Quiescent current | EN1 = EN2 = VIN, no load, device is not switching, TJ = 25°C, MODE = GND, both converters enabled | 38 | µA | ||
IQ | Quiescent current | EN1 = EN2 = VIN, no load, device is not switching, MODE = GND, both converters enabled | 33 | 80 | µA | |
ISD | Shutdown current | EN1 = EN2 = low, at TJ = 25°C | 2 | µA | ||
ISD | Shutdown current | EN1 = EN2 = GND, nominal value at TJ = 25°C, maximum value at TJ = 150°C | 1.5 | 26 | µA | |
VUVLO | Undervoltage lockout threshold | VIN rising | 2.5 | 2.6 | 2.75 | V |
VIN falling | 2.3 | 2.5 | 2.6 | V | ||
TJSD | Thermal shutdown threshold | TJ rising | 170 | °C | ||
Thermal shutdown hysteresis | TJ falling | 15 | °C | |||
CONTROL AND INTERFACE | ||||||
VEN,IH | Input-threshold voltage at EN1, EN2, rising edge | 1.06 | 1.1 | 1.15 | V | |
VEN,IL | Input-threshold voltage at EN1, EN2, falling edge | 0.96 | 1.0 | 1.05 | V | |
IEN,LKG | Input leakage current into EN1, EN2 | VIH = VIN or VIL = GND | 450 | nA | ||
VIH | High-level input-threshold voltage at MODE/SYNC | 1.1 | V | |||
VIL | Low-level input-threshold voltage at MODE/SYNC | 0.3 | V | |||
ILKG | Input leakage current into MODE/SYNC | 700 | nA | |||
tDelay | Enable delay time | Time from ENx high to device starts switching, VIN applied already | 110 | 200 | 300 | µs |
tDelay | Enable delay time if one converter already enabled | Time from ENx high to device starts switching, VIN applied already | 100 | µs | ||
tRamp | Output voltage ramp time | Time from device starts switching to power good; the device is not in current limit | 0.7 | 1.1 | 1.5 | ms |
fSYNC | Frequency range on MODE/SYNC pin for synchronization | 2 | 4 | MHz | ||
Resistance from COMP/FSET to GND for logic low | Internal frequency
setting with f = 2.25 MHz |
0 | 2.5 | kΩ | ||
Voltage on COMP/FSET for logic high | Internal frequency
setting with f = 2.25 MHz |
VIN | V | |||
VTH_PG | UVP power-good
threshold voltage; DC level |
Rising (%VFB) | 94% | 96.5% | 99% | |
VTH_PG | UVP power-good
threshold voltage; DC level |
Falling (%VFB) | 92% | 94.5% | 97% | |
VTH_PG | OVP power-good
threshold voltage; DC level |
Rising (%VFB) | 104% | 107% | 110% | |
OVP power-good
threshold voltage; DC level |
Falling (%VFB) | 102% | 104.5% | 107% | ||
VPG,OL | Low-level output voltage at PG | ISINK_PG = 2 mA | 0.07 | 0.3 | V | |
IPG,LKG | Input leakage current into PG | VPG = 5 V | 100 | nA | ||
tPG | PG deglitch time | For a high-level to low-level transition on the power-good output | 40 | µs | ||
OUTPUT | ||||||
VFB1, VFB2 | Feedback voltage | 0.6 | V | |||
IFB1,LKG, IFB2,LKG | Input leakage current into FB | VFB = 0.6 V | 1 | 80 | nA | |
VFB1, VFB2 | Feedback voltage accuracy | PWM, VIN ≥ VOUT + 1 V | –1% | 1% | ||
VFB1, VFB2 | Feedback voltage accuracy | PFM, VIN ≥ VOUT + 1 V, VOUT ≥ 1.5 V, Co,eff ≥ 22 µF, L = 0.47 µH | –1% | 2.5% | ||
VFB1, VFB2 | Feedback voltage accuracy | PFM, VIN ≥ VOUT + 1 V, 1 V ≤ VOUT < 1.5 V, Co,eff ≥ 47 µF, L = 0.47 µH | –1% | 2.5% | ||
Load regulation | PWM | 0.05 | %/A | |||
Line regulation | PWM, IOUT = 1 A, VIN ≥ VOUT + 1 V | 0.02 | %/V | |||
RDIS | Output discharge resistance | 50 | 150 | Ω | ||
fSW | PWM switching frequency range | See the FSET pin functionality about setting the switching frequency. | 1.8 | 2.25 | 4 | MHz |
fSW | PWM switching frequency | With COMP/FSET tied to GND or VIN | 2.025 | 2.25 | 2.475 | MHz |
fSW | PWM switching frequency tolerance | Using a resistor from COMP/FSET to GND | –16% | 17% | ||
ton,min | Minimum on time of high-side FET | VIN ≥ 3.3 V | 50 | 75 | ns | |
ton,min | Minimum on time of low-side FET | 30 | ns | |||
RDS(ON) | High-side FET on-resistance | VIN ≥ 5 V | 55 | 100 | mΩ | |
Low-side FET on-resistance | VIN ≥ 5 V | 25 | 50 | mΩ | ||
High-side MOSFET leakage current | VIN = 6 V; V(SW) = 0 V | 1 | 86 | µA | ||
Low-side MOSFET leakage current | V(SW) = 6 V | 1 | 205 | µA | ||
ILIMH | High-side FET switch current limit | DC value, for the
TPS62442; VIN = 3 V to 6 V |
3.8 | 4.7 | 5.5 | A |
ILIMH | High-side FET switch current limit | DC value, for the
TPS62441; VIN = 3 V to 6 V |
2.1 | 2.6 | 3.1 | A |
ILIMNEG | Low-side FET negative current limit | DC value | –1.8 | A |