SLVS501B February 2004 – September 2015 TPS65011
PRODUCTION DATA.
MIN | MAX | UNIT | |
---|---|---|---|
Input voltage on VAC pin with respect to AGND | 20 | V | |
Input voltage range on all other pins except AGND/PGND pins with respect to AGND | -0.3 | 7 | V |
HBM and CDM capabilities at pins VIB, PG, and LED2 | 1 | kV | |
Current at AC, VBAT, VINMAIN, L1, PGND1 | 1800 | mA | |
Peak current at all other pins | 1000 | mA | |
Continuous power dissipation | See Dissipation Ratings | ||
Operating free-air temperature, TA | -40 | 85 | °C |
Maximum junction temperature, TJ | 125 | °C | |
Storage temperature range, Tstg | -65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) | 1000 | V |
Charged device model (CDM), per JEDEC specification JESD22-C101(2) | 1000 | V |
MIN | NOM | MAX | UNIT | ||
---|---|---|---|---|---|
V(AC) | Supply voltage from AC adapter | 4.5 | 5.5 | V | |
V(USB) | Supply voltage from USB | 4.4 | 5.25 | V | |
V(BAT) | Voltage at battery charger | 2.5 | 4.2 | V | |
VI(MAIN),VI(CORE),VCC | Input voltage range step-down converters | 2.5 | 6.0 | V | |
VI(LDO1), VI(LDO2) | Input voltage range for LDOs | 1.8 | 6.5 | V | |
TA | Operating ambient temperature | -40 | 85 | °C | |
TJ | Operating junction temperature | -40 | 125 | °C | |
R(CC) | Resistor from VI(main),VI(core) to VCC used for filtering, CI(VCC) = 1 µF | 10 | 100 | Ω |
THERMAL METRIC(1) | TPS65011 | UNIT | |
---|---|---|---|
RGZ (VQFN) | |||
48 PIN | |||
RθJA | Junction-to-ambient thermal resistance | 27.0 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 14.3 | °C/W |
RθJB | Junction-to-board thermal resistance | 4.6 | °C/W |
ψJT | Junction-to-top characterization parameter | 0.2 | °C/W |
ψJB | Junction-to-board characterization parameter | 4.6 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | 1.1 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
CONTROL SIGNALS: LOW_PWR, SCLK, SDAT (INPUT) | |||||||
VIH | High level input voltage | IIH = 20 µA (1) | 2 | VCC | V | ||
VIL | Low level input voltage | IIL = 10 µA | 0 | 0.8 | V | ||
IIB | Input bias current | 0.01 | 1.0 | µA | |||
CONTROL SIGNALS: PB_ONOFF, HOT_RESET, BATT_COVER | |||||||
VIH | High level input voltage | IIH = 20 µA(1) | 0.8 VCC | 6 | V | ||
VIL | Low level input voltage | IIL = 10 µA | 0 | 0.4 | V | ||
R(pb_onoff) | Pulldown resistor at PB_ONOFF | 1000 | kΩ | ||||
R(hot_reset) | Pullup resistor at HOT_RESET, connected to VCC |
1000 | kΩ | ||||
R(batt_cover) | Pulldown resistor at BATT_COVER | 2000 | kΩ | ||||
t(glitch) | De-glitch time at all 3 pins | 38 | 56 | 77 | ms | ||
t(batt_cover) | Delay after t(glitch) (PWRFAIL goes low) before supplies are disabled when BATT_COVER goes low. | 1.68 | 2.4 | 3.2 | ms | ||
CONTROL SIGNALS: MPU_RESET, PWRFAIL, RESPWRON, INT, SDAT (OUTPUT) | |||||||
VOH | High level output voltage | 6 | V | ||||
VOL | Low level output voltage | IIL = 10 mA | 0 | 0.3 | V | ||
td(mpu_nreset) | Duration of low pulse at MPU_RESET | 100 | µs | ||||
td(nrespwron) | Duration of low pulse at RESPWRON after VMAIN is in regulation | TPOR = 0 | 80 | 100 | 120 | ms | |
TPOR = 1 | 800 | 1000 | 1200 | ||||
td(uvlo) | Time between UVLO going active (PWRFAIL going low) and supplies being disabled | 1.68 | 2.4 | 3.2 | ms | ||
td(overtemp) | Time between chip overtemperature condition being recognized (PWRFAIL going low) and supplies being disabled | 1.68 | 2.4 | 3.2 | ms | ||
SUPPLY PIN: VCC | |||||||
I(Q) | Operating quiescent current | VI = 3.6 V, current into Main + Core + VCC | 70 | µA | |||
IO(SD) | Shutdown supply current | VI = 3.6 V, BATT_COVER = GND, Current into Main + Core + VCC |
15 | 25 | µA | ||
VMAIN STEP-DOWN CONVERTER | |||||||
VI | Input voltage range | 2.5 | 6.0 | V | |||
IO | Maximum output current | 1000 | mA | ||||
IO(SD) | Shutdown supply current | BATT_COVER = GND | 0.1 | 1 | µA | ||
rDS(on) | P-channel MOSFET on-resistance | VI(MAIN) = VGS = 3.6 V | 110 | 210 | mΩ | ||
Ilkg(p) | P-channel leakage current | V(DS) = 6.0 V | 1 | µA | |||
rDS(on) | N-channel MOSFET on-resistance | VI(MAIN) = VGS = 3.6 V | 110 | 200 | mΩ | ||
Ilkg(N) | N-channel leakage current | V(DS) = 6.0 V | 1 | µA | |||
IL | P-channel current limit | 2.5 V< VI(MAIN) < 6.0 V | 1.4 | 1.75 | 2.1 | A | |
fS | Oscillator frequency | 1 | 1.25 | 1.5 | MHz | ||
VO(MAIN) | Fixed output voltage | 2.5 V | VI(MAIN) = 2.7 V to 6.0 V; IO= 0 mA | 0% | 3% | ||
VI(MAIN) = 2.7 V to 6.0 V; 0 mA ≤ IO≤ 1000 mA |
3% | 3% | |||||
2.75 V | VI(MAIN) = 2.95 V to 6.0 V; IO= 0 mA | 0% | 3% | ||||
VI(MAIN) = 2.95 V to 6.0 V; 0 mA ≤ IO≤ 1000 mA |
3% | 3% | |||||
3.0 V | VI(MAIN) = 3.2 V to 6.0 V; IO= 0 mA | 0% | 3% | ||||
VI(MAIN) = 3.2 V to 6.0 V; 0 mA ≤ IO≤ 1000 mA |
3% | 3% | |||||
3.3 V | VI(MAIN) = 3.5 V to 6.0 V; IO= 0 mA | 0% | 3% | ||||
VI(MAIN) = 3.5 V to 6.0 V; 0 mA ≤ IO≤ 1000 mA |
3% | 3% | |||||
Line regulation | VI(MAIN) = VO(MAIN) + 0.5 V (min. 2.5 V) to 6.0 V, IO = 10 mA |
0.5 | %/V | ||||
Load regulation | IO = 10 mA to 1000 mA | 0.12 | %/A | ||||
R(VMAIN) | VMAIN discharge resistance | 400 | Ω | ||||
VCORE STEP-DOWN CONVERTER | |||||||
VI | Input voltage range | 2.5 | 6.0 | V | |||
IO | Maximum output current | 400 | mA | ||||
IO(SD) | Shutdown supply current | BATT_COVER = GND | 0.1 | 1 | µA | ||
rDS(on) | P-channel MOSFET on-resistance | VI(CORE) = VGS = 3.6 V | 275 | 530 | mΩ | ||
Ilkg(p) | P-channel leakage current | VDS = 6.0 V | 0.1 | 1 | µA | ||
rDS(on) | N-channel MOSFET on-resistance | VI(CORE) = VGS = 3.6 V | 275 | 500 | mΩ | ||
Ilkg(N) | N-channel leakage current | VDS = 6.0 V | 0.1 | 1 | µA | ||
IL | P-channel current limit | 2.5 V< VI(CORE) < 6.0 V | 600 | 700 | 900 | mA | |
fS | Oscillator frequency | 1 | 1.25 | 1.5 | MHz | ||
VO(CORE) | Fixed output voltage | 0.85 V | VI(CORE) = 2.5 V to 6.0 V; IO= 0 mA, CO= 22 µF |
0% | 3% | ||
VI(CORE) = 2.5 V to 6.0 V; 0 mA ≤ IO≤ 400 mA, CO= 22 µF |
3% | 3% | |||||
1.0 V | VI(CORE) = 2.5 V to 6.0 V; IO= 0 mA, CO= 22 µF |
0% | 3% | ||||
VI(CORE) = 2.5 V to 6.0 V; 0 mA ≤ IO≤ 400 mA, CO= 22 µF |
3% | 3% | |||||
1.1 V | VI(CORE) = 2.5 V to 6.0 V; IO= 0 mA, CO= 22 µF |
0% | 3% | ||||
VI(CORE) = 2.5 V to 6.0 V; 0 mA ≤ IO≤ 400 mA, CO= 22 µF |
3% | 3% | |||||
1.2 V | VI(CORE) = 2.5 V to 6.0 V; IO= 0 mA | 0% | 3% | ||||
VI(CORE) = 2.5 V to 6.0 V; 0 mA ≤ IO≤ 400 mA | 3% | 3% | |||||
1.3 V | VI(CORE) = 2.5 V to 6.0 V; IO= 0 mA | 0% | 3% | ||||
VI(CORE) = 2.5 V to 6.0 V; 0 mA ≤ IO≤ 400 mA |
3% | 3% | |||||
1.4 V | VI(CORE) = 2.5 V to 6.0 V; IO= 0 mA | 0% | 3% | ||||
VI(CORE) = 2.5 V to 6.0 V; 0 mA ≤ IO≤ 400 mA |
3% | 3% | |||||
1.5 V | VI(CORE) = 2.5 V to 6.0 V; IO= 0 mA | 0% | 3% | ||||
VI(CORE) = 2.5 V to 6.0 V; 0 mA ≤ IO≤ 400 mA |
3% | 3% | |||||
1.8 V | VI(CORE) = 2.5 V to 6.0 V; IO= 0 mA | 0% | 3% | ||||
VI(CORE) = 2.5 V to 6.0 V; 0 mA ≤ IO≤ 400 mA |
3% | 3% | |||||
Line regulation | VI(CORE) = VO(MAIN) + 0.5 V (min. 2.5 V) to 6.00 V, IO = 10 mA |
1 | %/V | ||||
Load regulation | IO = 10 mA to 400 mA | 0.002 | %/mA | ||||
R(VCORE) | VCORE discharge resistance | 400 | Ω | ||||
VLDO1 and VLDO2 LOW-DROPOUT REGULATORS | |||||||
VI | Input voltage range | LD01 | 1.8 | 6.5 | V | ||
LD02 | 1.8 | VCC | |||||
VO | LDO1 output voltage range | 0.9 | VINLDO1 | V | |||
Vref | Reference voltage | 485 | 500 | 515 | mV | ||
VO | LDO2 output voltage range | 1.8 | 3.3 | V | |||
IO | Maximum output current | Full-power mode | 200 | mA | |||
Low-power mode | 30 | ||||||
I(SC) | LDO1 & LDO2 short-circuit current limit | VLDO1 = GND, VLDO2 = GND | 650 | mA | |||
Dropout voltage | IO= 200 mA, VINLDO1,2 = 1.8 V | 300 | mV | ||||
Total accuracy | ±3% | ||||||
Line regulation | VINLDO1,2 = VLDO1,2 + 0.5 V (min. 2.5 V) to 6.5 V, IO = 10 mA |
0.75 | %/V | ||||
Load regulation | IO = 10 mA to 200 mA | 0.011 | %/mA | ||||
Regulation time | Load change from 10% to 90% | 0.1 | ms | ||||
Low-power mode | 0.1 | ||||||
I(QFP) | LDO quiescent current (each LDO) | Full-power mode | 16 | 30 | µA | ||
I(QLPM) | LDO quiescent current (each LDO) | Low-power mode | 12 | 18 | µA | ||
IO(SD) | LDO shutdown current (each LDO) | 0.1 | 1 | µA | |||
Ilkg(FB) | Leakage current feedback | 0.01 | 0.1 | µA |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
V(AC) | Input voltage range | 4.5 | 5.5 | V | |||
V(USB) | Input voltage range | 4.35 | 5.25 | V | |||
ICC(VCHG) | Supply current | V(CHG) > V(CHG)min | 1.2 | 2 | mA | ||
ICC(SLP) | Sleep current | Sum of currents into VBAT pin, V(CHG) < V(SLP-ENTRY), 0°C≤ TJ ≤ 85°C |
2 | 5 | µA | ||
ICC(STBY) | Standby current | Current into USB pin | 45 | µA | |||
Current into AC pin | 200 | 400 | µA | ||||
VOLTAGE REGULATOR | |||||||
VO | Output voltage | V(CHG)min ≥ 4.5 V | 4.15 | 4.20 | 4.25 | V | |
VDO | Dropout voltage (V(AC) - VBAT) | VO(REG) + V(DO-MAX) ≤ V(CHG), IO(OUT) = 1 A |
500 | 800 | mV | ||
Dropout voltage (V(USB) - VBAT) | VO(REG) + V(DO-MAX)≤ V(CHG), IO(OUT) = 0.5 A |
300 | 500 | mV | |||
Dropout voltage (V(USB) - VBAT) | VO(REG) + V(DO-MAX) ≤ V(CHG), IO(OUT) = 0.1 A |
100 | 150 | mV | |||
CURRENT REGULATION | |||||||
IO(AC) | Output current range for AC operation(1) | VCHG ≥ 4.5V, VI(OUT) > V(LOWV), V(AC) - VI(BAT)> V(DO-MAX) |
100 | 1000 | mA | ||
V(SET) | Output current set voltage for AC operation at ISET pin. 100% output current I2C register CHGCONFIG<4:3> = 11 | Vmin ≥ 4.5V, VI(BAT) > V(LOWV), V(AC) - VI(BAT) > V(DO-MAX) | 2.45 | 2.50 | 2.55 | V | |
75% output current I2C register CHGCONFIG<4:3> = 10 | 1.83 | 1.91 | 1.99 | V | |||
50% output current I2C register CHGCONFIG<4:3> = 01 | 1.23 | 1.31 | 1.39 | V | |||
32% output current I2C register CHGCONFIG<4:3> = 00 | 0.76 | 0.81 | 0.86 | V | |||
KSET | Output current set factor for AC operation | 100 mA < IO < 1000 mA | 310 | 330 | 350 | ||
10 mA < IO < 100 mA | 300 | 340 | 380 | ||||
IO(USB) | Output current range for USB operation | V(CHG)min ≥ 4.35 V, VI(BAT) > V(LOWV), V(USB) - VI(BAT)> V(DO-MAX),
I2C register CHGCONFIG<2> = 0 |
80 | 100 | mA | ||
V(CHG)min ≥ 4.5 V, VI(BAT) > V(LOWV), VUSB - VI(BAT) > V(DO-MAX),
I2C register CHGCONFIG<2> = 1 |
400 | 500 | mA | ||||
R(ISET) | Resistor range at ISET pin | 825 | 8250 | Ω | |||
PRECHARGE CURRENT REGULATION, SHORT-CIRCUIT CURRENT, AND BATTERY DETECTION CURRENT | |||||||
V(LOWV) | Precharge to fast-charge transition threshold, voltage on VBAT pin. |
V(CHG)min ≥ 4.5V | 2.8 | 3.0 | 3.2 | V | |
De-glitch time | V(CHG)min ≥ 4.5 V, VI(OUT) decreasing below threshold; 100-ns fall time, 10-mV overdrive | 8.8 | 23 | 60 | ms | ||
I(PRECHG) | Precharge current (2) | 0 ≤ VI(OUT) < V(LOWV), t < t(PRECHG) | 10 | 100 | mA | ||
I(DETECT) | Battery detection current | 200 | µA | ||||
V(SET-PRECHG) | Voltage at ISET pin | 0 ≤ VI(OUT) < V(LOWV), t < t(PRECHG) | 240 | 255 | 270 | mV | |
CHARGE TAPER AND TERMINATION DETECTION | |||||||
I(TAPER) | Taper current detect range (3) | VI(OUT) > V(RCH), t < t(TAPER) | 10 | 100 | mA | ||
V(SET_TAPER) | Voltage at ISET pin for charge TAPER detection | VI(OUT) > V(RCH), t < t(TAPER) | 235 | 250 | 265 | mV | |
V(SET_TERM) | Voltage at ISET pin for charger termination detection(4) |
VI(OUT) > V(RCH) | 11 | 18 | 25 | mV | |
De-glitch time for I(TAPER) | V(CHG)min ≥ 4.5V, charging current increasing or decreasing above and below; 100-ns fall time, 10-mV overdrive |
8.8 | 23 | 60 | ms | ||
De-glitch time for I(TERM) | V(CHG)min ≥ 4.5 V, charging current decreasing below;100-ns fall time, 10-mV overdrive | 8.8 | 23 | 60 | ms | ||
TEMPERATURE COMPARATOR | |||||||
V(LTF) | Low (cold) temperature threshold | 2.475 | 2.50 | 2.525 | V | ||
V(HTF) | High (hot) temperature threshold | 0.485 | 0.5 | 0.515 | V | ||
I(TS) | TS current source | 95 | 102 | 110 | µA | ||
De-glitch time for temperature fault | 8.8 | 23 | 60 | ms | |||
BATTERY RECHARGE THRESHOLD | |||||||
V(RCH) | Recharge threshold | V(CHG)min≥ 4.5 V | VO(REG) -0.115 | VO(REG) -0.1 | VO(REG) -0.085 | V | |
De-glitch time | V(CHG)min ≥ 4.5 V, VI(OUT) decreasing below threshold; 100-ns fall time, 10-mV overdrive |
8.8 | 23 | 60 | ms | ||
TIMERS | |||||||
t(PRECHG) | Precharge timer | V(CHG)min ≥ 4.5 V | 1500 | 1800 | 2160 | s | |
t(TAPER) | Taper timer | V(CHG)min≥ 4.5 V | 1500 | 1800 | 2160 | s | |
t(CHG) | Charge timer | V(CHG)min≥ 4.5 V | 15000 | 18000 | 21600 | s | |
SLEEP AND STANDBY | |||||||
V(SLP-ENTRY) | Sleep-mode entry threshold, PG output = high | 2.3 V≤ VI(OUT) ≤ VO(REG) | V(CHG)≤ VI(OUT) +150 mV | V | |||
V(SLP_EXIT) | Sleep-mode exit threshold,PG output = low | 2.3 V≤ VI(OUT)≤ VO(REG) | V(CHG)≥ VI(OUT)+190 mV | V | |||
De-glitch time for sleep mode entry and exit | AC or USB decreasing below threshold; 100-ns fall time, 10-mV overdrive | 8.8 | 23 | 60 | ms | ||
t(USB_DEL) | Delay between valid USB voltage being applied and start of charging process from USB | 5 | ms | ||||
CHARGER POWER-ON-RESET, UVLO, AND V(IN) RAMP RATE | |||||||
V(CHGUVLO) | Charger undervoltage lockout | V(CHG) decreasing | 2.27 | 2.5 | 2.75 | V | |
Hysteresis | 27 | mV | |||||
V(CHGOVLO) | Charger overvoltage lockout | V(AC) increasing | 6.6 | V | |||
Hysteresis | 0.5 | V | |||||
CHARGER OVERTEMPERATURE SUSPEND | |||||||
T(suspend) | Temperature at which charger suspends operation |
145 | °C | ||||
T(hyst) | Hysteresis of suspend threshold | 20 | °C | ||||
LOGIC SIGNALS DEFMAIN, DEFCORE, PS_SEQ, IFLSB | |||||||
VIH | High level input voltage | IIH = 20 µA | VCC-0.5 | VCC | V | ||
VIL | Low level input voltage | IIL = 10 µA | 0 | 0.4 | V | ||
IIB | Input bias current | 0.01 | 1.0 | µA | |||
LOGIC SIGNALS GPIO1-4 | |||||||
VOL | Low level output voltage | IOL = 1 mA, configured as an open-drain output |
0.3 | V | |||
VOH | High level output voltage | Configured as an open-drain output | 6 | V | |||
VIL | Low level input voltage | 0 | 0.8 | V | |||
VIH | High level input voltage | 2 | VCC (5) | V | |||
II | Input leakage current | 1 | µA | ||||
rDS(on) | Internal NMOS | VOL = 0.3 V | 150 | Ω | |||
LOGIC SIGNALS PG, LED2 | |||||||
VOL | Low level output voltage | IOL = 20 mA | 0.5 | V | |||
VOH | High level output voltage | 6 | V | ||||
VIBRATOR DRIVER VIB | |||||||
VOL | Low level output voltage | IOL = 100 mA | 0.3 | 0.5 | V | ||
VOH | High level output voltage | 6 | V | ||||
THERMAL SHUTDOWN | |||||||
T(SD) | Thermal shutdown | Increasing junction temperature | 160 | °C | |||
UNDERVOLTAGE LOCKOUT | |||||||
V(UVLO) | Undervoltage lockout threshold. The default value for UVLO is 2.75 V |
V(UVLO) 2.5 V | Filter resistor = 10R in series with VCC, VCC decreasing |
-3% | 3% | ||
V(UVLO) 2.75 V | -3% | 3% | |||||
V(UVLO) 3.0 V | -3% | 3% | |||||
V(UVLO) 3.25 V | -3% | 3% | |||||
V(UVLO_HYST) | UVLO comparator hysteresis | VCC rising | 350 | 400 | 450 | mV | |
POWER GOOD | |||||||
VMAIN, VCORE, VLDO1, VLDO2 decreasing |
-12% | -10% | -8% | ||||
VMAIN, VCORE, VLDO1, VLDO2 increasing |
-7% | -5% | -3% |
MIN | MAX | UNIT | ||
---|---|---|---|---|
fMAX | Clock frequency | 400 | kHz | |
twH(HIGH) | Clock high time | 600 | ns | |
twL(LOW) | Clock low time | 1300 | ns | |
tR | DATA and CLK rise time | 300 | ns | |
tF | DATA and CLK fall time | 300 | ns | |
th(STA) | Hold time (repeated) START condition (after this period the first clock pulse is generated) | 600 | ns | |
th(DATA) | Setup time for repeated START condition | 600 | ns | |
th(DATA) | Data input hold time | 0 | ns | |
tsu(DATA) | Data input setup time | 100 | ns | |
tsu(STO) | STOP condition setup time | 600 | ns | |
t(BUF) | Bus free time | 1300 | ns |
AMBIENT TEMPERATURE |
MAX POWER DISSIPATION FOR TJ= 125°C(2) |
DERATING FACTOR ABOVE TA= 55°C |
---|---|---|
25°C | 3 W | 30 mW/°C |
55°C | 2.1 W | 30 mW/°C |
FIGURE | ||
---|---|---|
Efficiency | vs Output current | Figure 1, Figure 2, Figure 3, Figure 4 |
Quiescent current | vs Input voltage | Figure 5 |
Switching frequency | vs Temperature | Figure 6 |
Output voltage | vs Output current | Figure 7, Figure 8 |
LDO1 Output voltage | vs Output current | Figure 9 |
LDO2 Output voltage | vs Output current | Figure 10 |
Line transient response (main) | Figure 11 | |
Line transient response (core) | Figure 12 | |
Line transient response (LDO1) | Figure 13 | |
Line transient response (LDO2) | Figure 14 | |
Load transient response (main) | Figure 15 | |
Load transient response (core) | Figure 16 | |
Load transient response (LDO1) | Figure 17 | |
Load transient response (LDO2) | Figure 18 | |
Output Voltage Ripple (PFM) | Figure 19 | |
Output Voltage Ripple (PWM) | Figure 20 | |
Start-up timing | Figure 21 | |
Dropout voltage | vs Output current | Figure 22, Figure 23 |
PSRR (LDO1 and LDO2) | vs Frequency | Figure 24 |