SLUSDQ8D december 2019 – may 2023 TPS652353
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
INPUT SUPPLY | ||||||
VIN | Input voltage range | 4.5 | 12 | 20 | V | |
IDD(SDN) | Shutdown supply current | EN = 0b | 90 | 120 | 150 | µA |
ILDO(Q) | LDO quiescent current | EN = 1b, IO = 0 A, VVLNB = 18.2 V | 1.5 | 5 | 8.5 | mA |
UVLO | VIN undervoltage lockout | VIN rising | 4.15 | 4.3 | 4.45 | V |
Hysteresis | 280 | 480 | 550 | mV | ||
OUTPUT VOLTAGE | ||||||
VOUT | Regulated output voltage | V(ctrl) = 1, IO = 500 mA | 18 | 18.2 | 18.4 | V |
V(ctrl) = 0, IO = 500 mA | 13.25 | 13.4 | 13.55 | V | ||
SCL = 1b, V(ctrl) = 1, IO = 500 mA (Non I2C) | 19.18 | 19.4 | 19.62 | V | ||
SCL = 1b, V(ctrl) = 0, IO = 500 mA (Non I2C) | 14.44 | 14.6 | 14.76 | V | ||
I(OCP) | Output short circuit current limit | R(SET) = 200 kΩ, Full temperature | 580 | 650 | 720 | mA |
TJ = 25°C | 629 | 650 | 688 | mA | ||
fSW | Boost switching frequency | f = 1 MHz | 977 | 1060 | 1134 | kHz |
I(limitsw)(1) | Switching current limit | VIN = 12 V, VOUT = 18.2 V, R(SET) = 200 kΩ | 3 | A | ||
Rds(on)_LS | On resistance of low side FET | VIN = 12 V | 90 | 140 | 210 | mΩ |
V(drop) | Linear regulator voltage dropout | IO = 500 mA, TONEAMP = 0b | 0.44 | 0.8 | 1.15 | V |
IO = 500 mA, TONEAMP = 1b | 0.55 | 0.9 | 1.2 | V | ||
I(cable) | Cable good detection current threshold | VIN = 12 V, VOUT = 13.4 V or 18.2 V | 0.9 | 5 | 8.8 | mA |
I(rev) | Reverse bias current | EN = 1b, VVLNB = 21 V | 49 | 58 | 65 | mA |
I(rev_dis) | Disabled reverse bias current | EN = 0b, VVLNB = 21 V | 2.9 | 4.6 | 6.3 | mA |
LOGIC SIGNALS | ||||||
Enable threshold (V(EN)), high | 1.6 | V | ||||
Enable threshold (V(EN)), low | 0.8 | V | ||||
I(EN) | Enable internal pullup current | V(EN) = 1.5 V | 5 | 6 | 7 | µA |
V(EN) = 1 V | 2 | 3 | 4 | µA | ||
V(VCTRL_H) | VCTRL logic threshold level for high-level input voltage | 2 | V | |||
V(VCTRL_L) | VCTRL logic threshold level for low-level input voltage | 0.8 | V | |||
V(EXTM_H) | EXTM logic threshold level for high-level input voltage | 2 | V | |||
V(EXTM_L) | EXTM logic threshold level for low-level input voltage | 0.8 | V | |||
VOL(FAULT) | FAULT output low voltage | FAULT open drain, IOL = 1 mA | 0.4 | V | ||
TONE | ||||||
f(tone) | Tone frequency | 22-kHz tone output | 20 | 22 | 24 | kHz |
A(tone) | Tone amplitude | 0 mA ≤ IO ≤ 500 mA, CO = 100 nF, TONEAMP = 0b | 617 | 650 | 696 | mV |
0 mA ≤ IO ≤ 500 mA, CO = 100 nF, TONEAMP = 1b | 703 | 750 | 803 | mV | ||
D(tone) | Tone duty cycle | 45% | 50% | 55% | ||
f(EXTM) | External tone input frequency range | 22-kHz tone output | 17.6 | 22 | 26.4 | kHz |
44-kHz tone output | 35.2 | 44 | 52.8 | kHz | ||
TONE DETECTION | ||||||
f(DIN) | Tone detector frequency capture range | 0.4-VPP sine wave | 17.6 | 22 | 26.4 | kHz |
V(DIN) | Tone detector input amplitude | Sine wave, 22 kHz | 0.3 | 1.5 | V | |
V(DOUT) | DOUT output voltage | Tone present, Iload = 2 mA | 0.4 | V | ||
GDR | Bypass FET gate voltage, LNB | TONE_TRANS = 1b, V(LNB) = 18.2 V | 23.11 | 23.5 | 24.33 | V |
TONE_TRANS = 0b, V(LNB) = 18.2 V | 18.17 | 18.2 | 18.23 | V | ||
THERMAL SHUT-DOWN (JUNCTION TEMPERATURE) | ||||||
T(TRIP) | Thermal protection trip point | Temperature rising | 160 | °C | ||
T(HYST) | Thermal protection hysteresis | 20 | °C | |||
I2C READ BACK FAULT STATUS | ||||||
V(PGOOD) | PGOOD trip levels | Feedback voltage UVP low | 94% | 96% | 97.1% | |
Feedback voltage UVP high | 93% | 94.5% | 95.5% | |||
Feedback voltage OVP high | 104% | 106.6% | 108% | |||
Feedback voltage OVP low | 102% | 104.6% | 106% | |||
T(warn) | Temperature warning threshold | 125 | °C | |||
I2C INTERFACE | ||||||
VIH | SDA,SCL input high voltage | 2 | V | |||
VIL | SDA,SCL input low voltage | 0.8 | V | |||
II | Input current | SDA, SCL, 0.4 V ≤ VI ≤ 4.5 V | –10 | 10 | µA | |
VOL | SDA output low voltage | SDA open drain, IOL = 2 mA | 0.4 | V | ||
f(SCL) | Maximum SCL clock frequency | 400 | kHz |