SBVS068I February 2006 – January 2016 TPS717
PRODUCTION DATA.
An evaluation module (EVM) is available to assist in the initial circuit performance evaluation using the TPS717. The TPS717xxEVM-134 evaluation module (and related user's guide) can be requested at the Texas Instruments website through the product folders or purchased directly from the TI eStore.
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.