SBVS064O December 2005 – October 2024 TPS74201
PRODUCTION DATA
Using the thermal metrics ΨJT and ΨJB, shown in Section 5.4, the junction temperature can be estimated with corresponding formulas (given in Equation 6). For backwards compatibility, an older θJC,Top parameter is listed as well.
where
Both TT and TB can be measured on actual application boards using a thermo‐gun (an infrared thermometer).
For more information about measuring TT and TB, see the Using New Thermal Metrics application note, available for download at www.ti.com.
Compared with θJA, the new thermal metrics ΨJT and ΨJB are less independent of board size, but the metrics do have a small dependency. Figure 7-11 shows characteristic performance of ΨJT and ΨJB versus board size.
Looking at Figure 7-11, the RGW package thermal performance has negligible dependency on board size. The KTW package, however, does have a measurable dependency on board size. This dependency exists because the package shape is not point‐symmetric to an IC center. In the KTW package, for example (see Figure 7-10), silicon is not beneath the measuring point of TT, which is the center of the X and Y dimension, so that ΨJT has a dependency. Also, because of that non-point‐symmetry, device heat distribution on the PCB is not point‐symmetric, either, so that ΨJB has a dependency.
For a more detailed discussion of why TI does not recommend using θJC,Top to determine thermal characteristics, refer to the Using New Thermal Metrics application note, available for download at www.ti.com. Also, refer to the IC Package Thermal Metrics application note (also available on the TI website) for further information.