SBVS446A August   2023  – January 2024 TPS7A53B

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Voltage Regulation Features
        1. 6.3.1.1 DC Regulation
        2. 6.3.1.2 AC and Transient Response
      2. 6.3.2 System Start-Up Features
        1. 6.3.2.1 Programmable Soft-Start (NR/SS Pin)
        2. 6.3.2.2 Internal Sequencing
          1. 6.3.2.2.1 Enable (EN)
          2. 6.3.2.2.2 Undervoltage Lockout (UVLO) Control
          3. 6.3.2.2.3 Active Discharge
        3. 6.3.2.3 Power-Good Output (PG)
      3. 6.3.3 Internal Protection Features
        1. 6.3.3.1 Foldback Current Limit (ICL)
        2. 6.3.3.2 Thermal Protection (Tsd)
    4. 6.4 Device Functional Modes
      1. 6.4.1 Regulation
      2. 6.4.2 Disabled
      3. 6.4.3 Current Limit Operation
  8. 7 Application and Implementation
    1. 7.1 Application Information
      1. 7.1.1  Recommended Capacitor Types
        1. 7.1.1.1 Input and Output Capacitor Requirements (CIN and COUT)
        2. 7.1.1.2 Noise-Reduction and Soft-Start Capacitor (CNR/SS)
        3. 7.1.1.3 Feed-Forward Capacitor (CFF)
      2. 7.1.2  Soft-Start and Inrush Current
      3. 7.1.3  Optimizing Noise and PSRR
      4. 7.1.4  Charge Pump Noise
      5. 7.1.5  Current Sharing
      6. 7.1.6  Adjustable Operation
      7. 7.1.7  Power-Good Operation
      8. 7.1.8  Undervoltage Lockout (UVLO) Operation
      9. 7.1.9  Dropout Voltage (VDO)
      10. 7.1.10 Device Behavior During Transition From Dropout Into Regulation
      11. 7.1.11 Load Transient Response
      12. 7.1.12 Reverse Current Protection Considerations
      13. 7.1.13 Power Dissipation (PD)
      14. 7.1.14 Estimating Junction Temperature
      15. 7.1.15 TPS7A53EVM Thermal Analysis
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
      3. 7.2.3 Application Curves
    3. 7.3 Power Supply Recommendations
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
        1. 7.4.1.1 Board Layout
      2. 7.4.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Device Nomenclature
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation
    3. 8.3 Receiving Notification of Documentation Updates
    4. 8.4 Support Resources
    5. 8.5 Trademarks
    6. 8.6 Electrostatic Discharge Caution
    7. 8.7 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

8.6 Electrostatic Discharge Caution

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.