SLVSA62J March 2010 – March 2020 TPS7A60-Q1 , TPS7A61-Q1
PRODUCTION DATA.
Power dissipated in the device can be calculated using Equation 2.
where
As IQUIESCENT << IOUT, therefore, the term IQUIESCENT × VIN in Equation 2 can be ignored.
For a device under operation at a given ambient air temperature (TA), the junction temperature (TJ) can be calculated using Equation 3.
where
The rise in junction temperature due to power dissipation can be calculated using Equation 4.
For a given maximum junction temperature (TJ-Max), the maximum ambient air temperature (TA-Max) at which the device can operate can be calculated using Equation 5.
Example:
If IOUT = 100 mA, VOUT = 5 V, VIN = 14 V, IQUIESCENT = 250 µA and RθJA= 30˚C/W, the continuous power dissipated in the device is 0.9 W. The rise in junction temperature due to power dissipation is 27˚C. For a maximum junction temperature of 150˚C, maximum ambient air temperature at which the device can operate is 123˚C.
For adequate heat dissipation, it is recommended to solder the thermal pad (exposed heat sink) to a thermal land pad on the PCB. Doing this provides a heat conduction path from the die to the PCB and reduces overall package thermal resistance. Power derating curves for the TPS7A60-Q1 and TPS7A61-Q1 family of devices in the KTT (TO-263) and KVU (TO-252) packages are shown in Figure 26.
For optimum thermal performance, TI recommends to use a high-K PCB with thermal vias between the ground plane and solder pad or thermal land pad. This is shown in Figure 27 (a) and (b). Further, the heat-spreading capabilities of a PCB can be considerably improved by using a thicker ground plane and a thermal land pad with a larger surface area.
Keeping other factors constant, surface area of the thermal land pad contributes to heat dissipation only to a certain extent. Figure 28 shows the variation of RθJA with surface area of the thermal land pad (soldered to the exposed pad) for KTT and KVU packages.