SLVSH46A July 2023 – October 2023 TPS7H2140-SEP
PRODUCTION DATA
Refer to the PDF data sheet for device specific package drawings
When switching an inductive load off, the inductive reactance tends to pull the output voltage negative. Excessive negative voltage could cause the power FET to break down. To protect the power FET, an internal clamp between drain and source is internally implemented, namely VDS_CLAMP.
During the period of demagnetization (tdecay), the power FET is turned on for inductance-energy dissipation. The total energy is dissipated in the high-side switch (EHSS). Total energy includes the energy of the power supply (EIN) and the energy of the load (ELOAD). If resistance is in series with inductance, some of the load energy is dissipated on the resistance (ER) and the inductor itself (EL).
When an inductive load switches off, EHSS causes high thermal stressing on the device. The upper limit of the power dissipation depends on the device intrinsic capacity, ambient temperature, and board dissipation condition.
From the perspective of the high-side switch, EHSS equals the integration value during the demagnetization period.
When R approximately equals 0, EHSS) can be given simply as:
Figure 8-7 is a waveform of the device driving an inductive load and dissipating 40 mJ of energy across the NMOS pass-element (across IN and OUT1) during the inductive kick-back. The energy was controlled by turning off the channel # 1 at 2.8 (at IOUT1).
The displayed signal definitions are shown in Scope Signals Description
Channel # | Name of the Signal | Signal Color |
---|---|---|
1 | VEN1 | Blue |
2 | VIN | Red |
3 | VOUT1 | Green |
4 | IOUT1 | Magenta |
Math | EHSS1 | Cyan |
The device also optimizes the switching-off slew rate when the clamp is active. This optimization can help the system design by keeping the effects of transient power and EMI to a minimum.
Note that for PWM-controlled inductive loads, it is recommended to add the external freewheeling circuitry shown in Figure 8-8 to protect the device from repetitive power stressing. TVS is used to achieve the fast decay. See Figure 8-8 for more details.