Texas Instruments' 12-mm low-frequency (LF) glass transponders provide superior performance and operate at a resonance frequency of 134.2 kHz. The products are compliant to ISO/IEC 11784 and ISO/IEC 11785 global open standards. Texas Instruments LF glass transponders are manufactured with TI's patented tuning process to provide consistent read performance. Before delivery, the transponders undergo complete functional and parametric testing to provide the high quality customers have come to expect from TI.
PART NUMBER | PACKAGE | BODY SIZE (NOM)(2) |
---|---|---|
TRPGR30ATGC | TGC (0) | 2.12 mm x 12.0 mm |
Figure 1-1 shows the transponder.
DATE | REVISION | NOTES |
---|---|---|
August 2014 | * | Initial Release |
MIN | MAX | UNIT | ||
---|---|---|---|---|
TA | Operating temperature range | -25 | 85 | °C |
MIN | MAX | UNIT | ||
---|---|---|---|---|
TSTG | Storage temperature range | -40 | 85 | °C |
PARAMETER | TRPGR30ATGC |
---|---|
Functionality | Read only |
Memory (bits) | 80 (64-bit UID + 16-bit CRC) |
Memory (pages) | 1 |
Resonance frequency | 134.6 kHz |
Modulation | FSK (frequency shift keying) 134.2 kHz and 124.2 kHz |
Transmission principle | HDX (half duplex) |
Power source | Powered from the reader signal (battery-less) |
Typical reading range | ≤60 cm(1) |
Typical reading time | 70 ms |
Case material | Glass |
Protection glass | Hermetically sealed |
EMC | Programmed code is not affected by natural electromagnetic interference or x-rays |
Signal penetration | Transponder can be read through almost all nonmetallic material |
Mechanical shock | IEC 60068-2-32 free-fall drop test, 20 times from 1.5-m height |
Dimensions | Ø 2.12 ± 0.05 mm x 12.0 ± 0.5 mm |
Weight | 0.10 g |
The following documents describe the TRPGR30ATGC device. Copies of these documents are available on the Internet at www.ti.com.
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.
TI-RFid, E2E are trademarks of Texas Instruments.
All other trademarks are the property of their respective owners.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
Recipient agrees to not knowingly export or re-export, directly or indirectly, any product or technical data (as defined by the U.S., EU, and other Export Administration Regulations) including software, or any controlled product restricted by other applicable national regulations, received from Disclosing party under this Agreement, or any direct product of such technology, to any destination to which such export or re-export is restricted or prohibited by U.S. or other applicable laws, without obtaining prior authorization from U.S. Department of Commerce and other competent Government authorities to the extent required by those laws.
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.