SLLSFK6 September   2021 TUSB217A-Q1

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Device Comparison
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Switching Characteristics
    7. 7.7 Timing Requirements
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 High-Speed Boost
      2. 8.3.2 RX Sensitivity
    4. 8.4 Device Functional Modes
      1. 8.4.1 Low-Speed (LS) Mode
      2. 8.4.2 Full-Speed (FS) Mode
      3. 8.4.3 High-Speed (HS) Mode
      4. 8.4.4 High-Speed Downstream Port Electrical Compliance Test Mode
      5. 8.4.5 Shutdown Mode
      6. 8.4.6 I2C Mode
      7. 8.4.7 BC 1.2 Battery Charging Controller
    5. 8.5 TUSB217A-Q1 Registers
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Test Procedure to Construct USB High-speed Eye Diagram
          1. 9.2.2.1.1 For a Host Side Application
          2. 9.2.2.1.2 For a Device Side Application
      3. 9.2.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Receiving Notification of Documentation Updates
    2. 12.2 Support Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

9.1 Application Information

The purpose of the TUSB217A-Q1 is to re-store the signal integrity of a USB High-speed channel up to the USB connector. The loss in signal quality stems from reduced channel bandwidth due to high loss PCB trace and other components that contribute a capacitive load. This can cause the channel to fail the USB near end eye mask. Proper use of the TUSB217A-Q1 can help to pass this eye mask.

A secondary purpose is to use the CD pin of the TUSB217A-Q1 to control other blocks on the customer platform, if so desired.