SLVSED4A December 2017 – March 2018 TVS1800
PRODUCTION DATA.
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VRWM | Reverse Stand-off Voltage | -0.5 | 18 | V | ||
ILEAK | Leakage Current | Measured at VIN = VRWM, TA = 27°C | 1.2 | 13 | nA | |
Measured at VIN = VRWM, TA = 85°C | 9 | 330 | nA | |||
Measured at VIN = VRWM, TA = 105°C | 52 | 1150 | nA | |||
VF | Forward Voltage | IIN = 1 mA from GND to IO | 0.25 | 0.5 | 0.65 | V |
VBR | Break-down Voltage | IIN = 1 mA from IO to GND | 19.5 | 21.3 | 23.8 | V |
VFCLAMP | Forward Clamp Voltage | 40 A IEC 61000-4-5 Surge (8/20 µs) from GND to IO, 27°C | 1 | 2 | 5 | V |
VCLAMP | Clamp Voltage | 24 A IEC 61000-4-5 Surge (8/20 µs) from IO to GND, VIN = 0 V before surge, 27°C | 22.5 | 23 | V | |
40 A IEC 61000-4-5 Surge (8/20 µs) from IO to GND, VIN = 0 V before surge, 27°C | 22.7 | 23.4 | V | |||
35 A IEC 61000-4-5 Surge (8/20 µs) from IO to GND, VIN = Vrwm before surge, TA = 125°C | 23.7 | 24.7 | V | |||
RDYN | 8/20 µs surge dynamic resistance | Calculated from VCLAMP at .5*Ipp and Ipp surge current levels, 27°C | 30 | mΩ | ||
CIN | Input pin capacitance | VIN = VRWM, f = 1 MHz, 30 mVpp, IO to GND | 116 | pF | ||
SR | Maximum Slew Rate | 0-VRWM rising edge, sweep rise time and measure slew rate when IPK = 1 mA, 27°C | 2.5 | V/µs | ||
0-VRWM rising edge, sweep rise time and measure slew rate when IPK = 1 mA, 105°C | 0.7 | V/µs |