SLVSEQ3B September 2018 – May 2022 TVS1801
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
ILEAK | Leakage Current | Measured at VIN = ±VRWM, TA = 27°C | 0.4 | 25 | nA | |
Measured at VIN = ±VRWM, TA = 85°C | 290 | |||||
VBR | Break-down Voltage | IIN = ±1 mA | 23.35 | 24.4 | V | |
VCLAMP | Clamp Voltage | ±Ipp IEC 61000-4-5 Surge (8/20 µs), VIN = 0 V before surge, TA = 27°C | 27.4 | 28.8 | V | |
±IPP IEC 61000-4-5 Surge (8/20 µs), VIN =±VRWM before surge, TA = 125°C | 30.4 | |||||
RDYN | 8/20 µs surge dynamic resistance | Calculated from VCLAMP at .5*IPP and IPP surge current, TA = 25°C | 50 | mΩ | ||
CIN | Input pin capacitance | VIN = VRWM, f = 1 MHz, 30 mVpp, IO to GND | 65 | pF | ||
SR | Maximum Slew Rate | 0-±VRWM rising edge, sweep rise time and measure slew rate when IPEAK = 1 mA, TA = 27°C | 2.5 | V/µs | ||
0-±VRWM rising edge, sweep rise time and measure slew rate when IPEAK = 1 mA, TA = 85°C | 1 |