SCES931B April   2021  – March 2022 TXU0204-Q1

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Related Products
  6. 6 Pin Configuration and Functions—TXU0204-Q1
  7. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Electrical Characteristics
    6. 7.6  Switching Characteristics: Tsk, TMAX
    7. 7.7  Switching Characteristics, VCCA = 1.2 ± 0.1 V
    8. 7.8  Switching Characteristics, VCCA = 1.5 ± 0.1 V
    9. 7.9  Switching Characteristics, VCCA = 1.8 ± 0.15 V
    10. 7.10 Switching Characteristics, VCCA = 2.5 ± 0.2 V
    11. 7.11 Switching Characteristics, VCCA = 3.3 ± 0.3 V
    12. 7.12 Switching Characteristics, VCCA = 5.0 ± 0.5 V
    13. 7.13 Operating Characteristics
    14. 7.14 Typical Characteristics
  8. 8 Parameter Measurement Information
    1. 8.1 Load Circuit and Voltage Waveforms
  9. 9 Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1  CMOS Schmitt-Trigger Inputs with Integrated Pulldowns
        1. 9.3.1.1 Inputs with Integrated Static Pull-Down Resistors
      2. 9.3.2  Control Logic (OE) with VCC(MIN) Circuitry
      3. 9.3.3  Balanced High-Drive CMOS Push-Pull Outputs
      4. 9.3.4  Partial Power Down (Ioff)
      5. 9.3.5  VCC Isolation and VCC Disconnect
      6. 9.3.6  Over-Voltage Tolerant Inputs
      7. 9.3.7  Glitch-Free Power Supply Sequencing
      8. 9.3.8  Negative Clamping Diodes
      9. 9.3.9  Fully Configurable Dual-Rail Design
      10. 9.3.10 Supports High-Speed Translation
      11. 9.3.11 Wettable Flanks
    4. 9.4 Device Functional Modes
  10. 10Application and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
      3. 10.2.3 Application Curve
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Device Support
      1. 13.1.1 Regulatory Requirements
    2. 13.2 Documentation Support
      1. 13.2.1 Related Documentation
    3. 13.3 Receiving Notification of Documentation Updates
    4. 13.4 Support Resources
    5. 13.5 Trademarks
    6. 13.6 Electrostatic Discharge Caution
    7. 13.7 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

13.6 Electrostatic Discharge Caution

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.