SLUSF14 august   2023 UCC15241-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Revision History
  6. 5 Device Comparison
  7. 6 Pin Configuration and Functions
  8. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Safety Limiting Values
  9. 8 Safety-Related Certifications
  10. 9 Insulation Characteristics
  11. 10Typical Characteristics
  12. 11Detailed Description
    1. 11.1 Overview
    2. 11.2 Functional Block Diagram
    3. 11.3 Feature Description
      1. 11.3.1 Power Stage Operation
        1. 11.3.1.1 VDD-VEE Voltage Regulation
        2. 11.3.1.2 COM-VEE Voltage Regulation
        3. 11.3.1.3 Power Handling Capability
      2. 11.3.2 Output Voltage Soft Start
      3. 11.3.3 ENA and PG
      4. 11.3.4 Protection Functions
        1. 11.3.4.1 Input Undervoltage Lockout
        2. 11.3.4.2 Input Overvoltage Lockout
        3. 11.3.4.3 Output Undervoltage Protection
        4. 11.3.4.4 Output Overvoltage Protection
        5. 11.3.4.5 Overpower Protection
        6. 11.3.4.6 Overtemperature Protection
    4. 11.4 Device Functional Modes
  13. 12Application and Implementation
    1. 12.1 Application Information
    2. 12.2 Typical Application
      1. 12.2.1 Design Requirements
      2. 12.2.2 Detailed Design Procedure
        1. 12.2.2.1 Capacitor Selection
        2. 12.2.2.2 Single RLIM Resistor Selection
        3. 12.2.2.3 RDR Circuit Component Selection
        4. 12.2.2.4 Feedback Resistors Selection
      3. 12.2.3 Application Curves
    3. 12.3 System Examples
    4. 12.4 Power Supply Recommendations
    5. 12.5 Layout
      1. 12.5.1 Layout Guidelines
      2. 12.5.2 Layout Example
  14. 13Device and Documentation Support
    1. 13.1 Documentation Support
      1. 13.1.1 Related Documentation
    2. 13.2 Receiving Notification of Documentation Updates
    3. 13.3 Support Resources
    4. 13.4 Trademarks
    5. 13.5 Electrostatic Discharge Caution
    6. 13.6 Glossary
  15. 14Mechanical, Packaging, and Orderable Information
  16. 15Tape and Reel Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

9 Insulation Characteristics

Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown (TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal device and high voltage applied between the two sides; The insulation breakdown data is collected at various high voltages switching at 60 Hz over temperature. For reinforced insulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1 part per million (ppm). Even though the expected minimum insulation lifetime is 20 years at the specified working isolation voltage, VDE reinforce certification requires additional safety margin of 20% for working voltage and 50% for lifetime which translates into minimum required insulation lifetime of 30 years at a working voltage that's 20% higher than the specified value. The TDDB projection line shows the intrinsic capability of the isolation barrier to withstand high voltage stress over its lifetime. Based on the TDDB data, the intrinsic capability of the insulation is 1000 VRMS with a lifetime >>100 years.

GUID-36748837-576B-44EF-98B3-0419D2AB1541-low.png Figure 9-1 TDDB: Insulation Lifetime Projection for 1000 Vrms Working Voltage.