12 Revision History
Changes from Revision C (May 2023) to Revision D (June 2024)
- Changed device temperature gradeGo
- Deleted ESD classifications from FeaturesGo
Changes from Revision B (December 2019) to Revision C (May 2023)
- Added Safety-related certifications to FeaturesGo
- Added AEC-Q100 sub bullets to FeaturesGo
- Added what to do with unused pins to pin functions
table.Go
- Changed recommended value of decoupling capacitors. Go
- Added recommended decoupling capacitor layout placement. Go
- Changed test conditions per DIN EN IEC 60747-17 (VDE
0884-17)Go
- Changed certification statusGo
- Changed VAin lower limit to 0.6VGo
- Changed direction of ICLMPI in VCLP-CLMPI test
conditionGo
- Added test condition for soft turn-off currentGo
- Deleted short circuit clamping max conditionGo
- Change OC figureGo
- Added function state showing gate
driver turning on. Changed RDY condition when VCC
is PD. Go
- Changed OC figureGo
- Change OC figureGo
- Change OC figureGo
- Deleted tie dot from Figure 8-16
Go
Changes from Revision A (May 2019) to Revision B (December 2019)
- Changed Marketing status from Advance Information to production data.Go