SLVSC86A January 2014 – March 2014 UCD9244-EP
PRODUCTION DATA.
The ADC operates in a continuous conversion sequence that measures each rail's output voltage and output current, plus six other variables (input voltage, internal temperature, and four external temperature sensors). The length of the sequence is determined by the number of output rails (NumRails) configured for use. The time to complete the monitoring sampling sequence is give by the formula: tADC_SEQ = tADC × (2 × NumRAILS + 6)
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tADC | ADC single-sample time | 3.84 | µs | |||
tADC_SEQ | ADC sequencer interval | Min = 2 × 1 Rail + 6 = 8 samples Max = 2 × 4 Rails + 6 = 14 samples |
30.72 | 53.76 | µs |
The most recent ADC conversion results are periodically converted into the proper measurement units (volts, amperes, degrees), and each measurement is compared to its corresponding fault and warning limits. The monitoring operates asynchronously to the ADC, at intervals shown in the table below.
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tVout | Output voltage monitoring interval | 200 | µs | |||
tIout | Output current monitoring interval | 200×NRails | µs | |||
tVin | Input voltage monitoring interval | 1 | ms | |||
tTEMP | Temperature monitoring interval | 100 | ms | |||
tAUXADC | Auxiliary ADC monitoring interval | 100 | ms |
Because the ADC sequencer and the monitoring comparisons are asynchronous to each other, the response time to a fault condition depends on where the event occurs within the monitoring interval and within the ADC sequence interval. Once a fault condition is detected, some additional time is required to determine the correct action based on the FAULT_RESPONSE code, and then to perform the appropriate response. The following table lists the worse-case fault response times.
PARAMETER | TEST CONDITIONS | TYP | MAX no VID | MAX /w VID(3) | UNIT | |
---|---|---|---|---|---|---|
tOVF, tUVF | Over-/under-voltage fault response time during normal operation | Normal regulation, no PMBus activity, 4 stages enabled |
250 | 800 | µs | |
tOVF, tUVF | Over-/under-voltage fault response time, during data logging | During data logging to nonvolatile memory(1) | 800 | 1000 | µs | |
tOVF, tUVF | Over-/under-voltage fault response time, when tracking or sequencing enable | During tracking and soft-start ramp. | 400 | µs | ||
tOCF, tUCF | Over-/under-current fault response time during normal operation | Normal regulation, no PMBus activity, 4 stages enabled 75% to 125% current step(2) |
100 + (600 × NRails) |
5000 | µs | |
tOCF, tUCF | Over-/under-current fault response time, during data logging | During data logging to nonvolatile memory 75% to 125% current step | 600 + (600 × NRails) |
5000 | µs | |
tOTF | Over-temperature fault response time | Temperature rise of 10°C/sec, at OT threshold | 1.60 | sec | ||
t3-State | Time to tristate the PWM output after a shutdown is initiated | DRIVER_CONFIG = 0x01 | 5.5 | µs |