II is fixed for measuring VCE(sat), variable
for measuring hFE.
Figure 6-5 hFE, VCE(sat) Test Circuit
Figure 6-2 ICEX Test Circuit
Figure 6-4 II Test Circuit
Figure 6-6 VI(on) Test Circuit
Figure 6-7 IR Test Circuit
Figure 6-8 VF Test Circuit
Figure 6-9 Propagation Delay-Time Waveforms
The pulse
generator has the following characteristics: PRR = 12.5 kHz,
ZO = 50 Ω.
CL includes probe and jig capacitance.
For
testing the ULN2003A device, ULN2003AI device, and ULQ2003A devices,
VIH = 3 V; for the ULN2002A device, VIH = 13
V; for the ULN2004A and the ULQ2004A devices, VIH = 8
V.
Figure 6-10 Latch-Up Test Circuit and Voltage Waveforms