6.1 Absolute Maximum Ratings
at 25°C free-air temperature (unless otherwise noted)(1)
|
MIN |
MAX |
UNIT |
VCC |
Collector-emitter voltage |
|
50 |
V |
|
Clamp diode reverse voltage(2) |
|
50 |
V |
VI |
Input voltage(2) |
|
30 |
V |
|
Peak collector current(3)(4) |
|
500 |
mA |
IOK |
Output clamp current |
|
500 |
mA |
|
Total emitter-terminal current |
|
–2.5 |
A |
TJ |
Operating virtual junction temperature |
|
150 |
°C |
Tstg |
Storage temperature |
–65 |
150 |
°C |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to the emitter/substrate terminal E, unless otherwise noted.
(3) Maximum power dissipation is a function of TJ(max), θJA, and TA. The maximum allowable power dissipation at any allowable ambient temperature is PD = (TJ(max) – TA)/θJA. Operating at the absolute maximum TJ of 150°C can affect reliability.
(4) The package thermal impedance is calculated in accordance with JESD 51-7.
6.2 ESD Ratings
|
VALUE |
UNIT |
V(ESD) |
Electrostatic discharge |
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) |
2000 |
V |
Charged device model (CDM), per JEDEC specification JESD22-C101(2) |
500 |
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.